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Shin Hong
Shin Hong
Chungbuk National Univeristy, Republic of Korea
Verified email at chungbuk.ac.kr - Homepage
Title
Cited by
Cited by
Year
Testing concurrent programs to achieve high synchronization coverage
S Hong, J Ahn, S Park, M Kim, MJ Harrold
Proceedings of the 2012 International Symposium on Software Testing and ・, 2012
872012
Mutation-Based Fault Localization for Real-World Multilingual Programs
S Hong, B Lee, T Kwak, Y Jeon, B Ko, Y Kim, M Kim
IEEE/ACM International Conference on Automated Software Engineering (ASE), 2015
792015
Detecting concurrency errors in client-side java script web applications
S Hong, Y Park, M Kim
2014 IEEE Seventh International Conference on Software Testing, Verification ・, 2014
662014
Understanding user understanding: determining correctness of generated program invariants
M Staats, S Hong, M Kim, G Rothermel
Proceedings of the 2012 International Symposium on Software Testing and ・, 2012
432012
MUSEUM: Debugging Real-World Multilingual Programs Using Mutation Analysis
S Hong, T Kwak, B Lee, Y Jeon, B Ko, Y Kim, M Kim
Information and Software Technology 82, 80-95, 2017
372017
A survey of race bug detection techniques for multithreaded programmes
S Hong, M Kim
Software Testing, Verification and Reliability 25 (3), 191-217, 2015
362015
Classifying False Positive Static Checker Alarms In Continuous Integration Using Convolutional Neural Networks
SL Lee, S Hong, J Yi, T Kim, CJ Kim, S Yoo
International Conference on Software Testing, Verification and Validation ・, 2019
352019
The impact of concurrent coverage metrics on testing effectiveness
S Hong, M Staats, J Ahn, M Kim, G Rothermel
2013 IEEE Sixth International Conference on Software Testing, Verification ・, 2013
222013
Effective pattern-driven concurrency bug detection for operating systems
S Hong, M Kim
Journal of Systems and Software 86 (2), 377-388, 2013
222013
Target-driven Compositional Concolic Testing with Function Summary Refinement for Effective Bug Detection
Y Kim, S Hong, M Kim
ESEC/FSE 2019, 2019
212019
Are concurrency coverage metrics effective for testing: a comprehensive empirical investigation
S Hong, M Staats, J Ahn, M Kim, G Rothermel
Software Testing, Verification and Reliability 25 (4), 334-370, 2015
212015
Invasive Software Testing: Mutating Target Programs to Diversify Test Exploration for High Test Coverage
Y Kim, S Hong, B Ko, LD Phan, M Kim
2018 11th IEEE International Conference on Software Testing, Verification ・, 2018
162018
Systematic testing of reactive software with non-deterministic events: a case study on LG electric oven
Y Park, S Hong, M Kim, D Lee, J Cho
International Conference on Software Engineering (ICSE) 2, 29-38, 2015
142015
Predictive mutation analysis via the natural language channel in source code
J Kim, J Jeon, S Hong, S Yoo
ACM Transactions on Software Engineering and Methodology (TOSEM) 31 (4), 1-27, 2022
92022
DEMINER: test generation for high test coverage through mutant exploration
Y Kim, S Hong
Software Testing, Verification and Reliability 31 (1-2), e1715, 2021
82021
Model-based kernel testing for concurrency bugs through counter example replay
M Kim, S Hong, C Hong, T Kim
Electronic Notes in Theoretical Computer Science 253 (2), 21-36, 2009
72009
Repairing fragile gui test cases using word and layout embedding
J Yoon, S Chung, K Shin, J Kim, S Hong, S Yoo
2022 IEEE Conference on Software Testing, Verification and Validation (ICST ・, 2022
42022
Empirical study of effectiveness of evosuite on the sbst 2020 tool competition benchmark
RS Herlim, S Hong, Y Kim, M Kim
Search-Based Software Engineering: 13th International Symposium, SSBSE 2021 ・, 2021
32021
Threats to validity in experimenting mutation-based fault localization
J Jeon, S Hong
Proceedings of the ACM/IEEE 42nd International Conference on Software ・, 2020
32020
Learning-based mutant reduction using fine-grained mutation operators
Y Kim, S Hong
Software Testing, Verification & Reliability, 0
3*
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