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Co-authors
- Jaekyun MoonUniversity of Minnesota, KAIST, Carnegie Mellon UniversityVerified email at kaist.edu
- Minseok ChoiKyung Hee UniversityVerified email at khu.ac.kr
- Christopher G. BrintonElmore Rising Star Associate Professor of ECE, Purdue UniversityVerified email at purdue.edu
- Jy-yong SohnYonsei UniversityVerified email at yonsei.ac.kr
- Seyyedali Hosseinalipour (Ali Alipour)Assistant Professor of Electrical Engineering, University at Buffalo, SUNYVerified email at buffalo.edu
- Mung ChiangPurdue UniversityVerified email at purdue.edu
- David J. LoveNick Trbovich Professor of ECE, Purdue UniversityVerified email at ecn.purdue.edu
- Abolfazl HashemiAssistant Professor of ECE, Purdue UniversityVerified email at purdue.edu
- Sae-Young ChungProfessor of Electrical Engineering, KAISTVerified email at kaist.ac.kr
- Shiqiang WangIBM T. J. Watson Research CenterVerified email at us.ibm.com
- Yong H. LeeDept. of Electrical Eng. KAISTVerified email at kaist.ac.kr