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Ken Mai
Ken Mai
Carnegie Mellon University, Stanford University
Verified email at ece.cmu.edu
Title
Cited by
Cited by
Year
The future of wires
R Ho, KW Mai, MA Horowitz
Proceedings of the IEEE 89 (4), 490-504, 2001
18972001
Smart memories: A modular reconfigurable architecture
K Mai, T Paaske, N Jayasena, R Ho, WJ Dally, M Horowitz
Proceedings of 27th International Symposium on Computer Architecture (IEEE …, 2000
5912000
Error patterns in MLC NAND flash memory: Measurement, characterization, and analysis
Y Cai, EF Haratsch, O Mutlu, K Mai
2012 Design, Automation & Test in Europe Conference & Exhibition (DATE), 521-526, 2012
4292012
Multi-bit error tolerant caches using two-dimensional error coding
J Kim, N Hardavellas, K Mai, B Falsafi, J Hoe
40th Annual IEEE/ACM International Symposium on Microarchitecture (MICRO …, 2007
3572007
Threshold voltage distribution in MLC NAND flash memory: Characterization, analysis, and modeling
Y Cai, EF Haratsch, O Mutlu, K Mai
2013 Design, Automation & Test in Europe Conference & Exhibition (DATE …, 2013
3392013
Single-chip heterogeneous computing: Does the future include custom logic, FPGAs, and GPGPUs?
ES Chung, PA Milder, JC Hoe, K Mai
2010 43rd annual IEEE/ACM international symposium on microarchitecture, 225-236, 2010
3332010
Data retention in MLC NAND flash memory: Characterization, optimization, and recovery
Y Cai, Y Luo, EF Haratsch, K Mai, O Mutlu
2015 IEEE 21st International Symposium on High Performance Computer …, 2015
2802015
Flash correct-and-refresh: Retention-aware error management for increased flash memory lifetime
Y Cai, G Yalcin, O Mutlu, EF Haratsch, A Cristal, OS Unsal, K Mai
2012 IEEE 30th International Conference on Computer Design (ICCD), 94-101, 2012
2762012
Digital circuit design challenges and opportunities in the era of nanoscale CMOS
BH Calhoun, Y Cao, X Li, K Mai, LT Pileggi, RA Rutenbar, KL Shepard
Proceedings of the IEEE 96 (2), 343-365, 2008
2512008
Program interference in MLC NAND flash memory: Characterization, modeling, and mitigation
Y Cai, O Mutlu, EF Haratsch, K Mai
2013 IEEE 31st International Conference on Computer Design (ICCD), 123-130, 2013
2362013
Read disturb errors in MLC NAND flash memory: Characterization, mitigation, and recovery
Y Cai, Y Luo, S Ghose, O Mutlu
2015 45th Annual IEEE/IFIP International Conference on Dependable Systems …, 2015
1982015
CoRAM: an in-fabric memory architecture for FPGA-based computing
ES Chung, JC Hoe, K Mai
Proceedings of the 19th ACM/SIGDA international symposium on Field …, 2011
1782011
CoRAM: an in-fabric memory architecture for FPGA-based computing
ES Chung, JC Hoe, K Mai
Proceedings of the 19th ACM/SIGDA international symposium on Field …, 2011
1782011
Low-power SRAM design using half-swing pulse-mode techniques
KW Mai, T Mori, BS Amrutur, R Ho, B Wilburn, MA Horowitz, I Fukushi, ...
IEEE Journal of Solid-State Circuits 33 (11), 1659-1671, 1998
1751998
Efficient on-chip global interconnects
R Ho, K Mai, M Horowitz
2003 Symposium on VLSI Circuits. Digest of Technical Papers (IEEE Cat. No …, 2003
1552003
Vulnerabilities in MLC NAND flash memory programming: Experimental analysis, exploits, and mitigation techniques
Y Cai, S Ghose, Y Luo, K Mai, O Mutlu, EF Haratsch
2017 IEEE International Symposium on High Performance Computer Architecture …, 2017
1322017
An efficient reliable PUF-based cryptographic key generator in 65nm CMOS
M Bhargava, K Mai
2014 Design, Automation & Test in Europe Conference & Exhibition (DATE), 1-6, 2014
1282014
ProtoFlex: Towards scalable, full-system multiprocessor simulations using FPGAs
ES Chung, MK Papamichael, E Nurvitadhi, JC Hoe, K Mai, B Falsafi
ACM Transactions on Reconfigurable Technology and Systems (TRETS) 2 (2), 1-32, 2009
1122009
Applications of on-chip samplers for test and measurement of integrated circuits
R Ho, B Amrutur, K Mai, B Wilburn, T Mori, M Horowitz
1998 Symposium on VLSI Circuits. Digest of Technical Papers (Cat. No …, 1998
1061998
Reliability enhancement of bi-stable PUFs in 65nm bulk CMOS
M Bhargava, C Cakir, K Mai
2012 IEEE International Symposium on Hardware-Oriented Security and Trust, 25-30, 2012
1002012
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