| Proxy anchor loss for deep metric learning S Kim, D Kim, M Cho, S Kwak Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern …, 2020 | 138 | 2020 |
| Deep metric learning beyond binary supervision S Kim, M Seo, I Laptev, M Cho, S Kwak Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern …, 2019 | 72 | 2019 |
| Embedding transfer with label relaxation for improved metric learning S Kim, D Kim, M Cho, S Kwak Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern …, 2021 | 9 | 2021 |
| Learning to Generate Novel Classes for Deep Metric Learning K Lee, S Kim, S Hong, S Kwak arXiv preprint arXiv:2201.01008, 2022 | | 2022 |
| Self-Taught Metric Learning without Labels S Kim, D Kim, M Cho, S Kwak Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern …, 2022 | | 2022 |
| Embedding Transfer via Smooth Contrastive Loss S Kim, D Kim, M Cho, S Kwak | | 2020 |
| Embedding Transfer with Label Relaxation for Improved Metric Learning—Supplementary Material— S Kim, D Kim, M Cho, S Kwak | | |
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