S. M. Yalisove
S. M. Yalisove
Professor of Materials Science and Engineering, University of Michigan
Verified email at umich.edu
Title
Cited by
Cited by
Year
Silicon surface morphologies after femtosecond laser irradiation
BR Tull, JE Carey, E Mazur, JP McDonald, SM Yalisove
Mrs Bulletin 31 (8), 626-633, 2006
2092006
Surface and grain boundary segregation in relation to intergranular fracture: boron and sulfur in Ni/sub 3/Al
CL White, CT Liu, RA Padgett, SM Yalisove
Scr. Metall.;(United States) 18 (12), 1984
1631984
Femtosecond laser micromachining of a single-crystal superalloy
Q Feng, YN Picard, H Liu, SM Yalisove, G Mourou, TM Pollock
Scripta Materialia 53 (5), 511-516, 2005
1532005
Multilayer rippled structure of the NiAl (110) surface: a medium energy ion scattering study
SM Yalisove, WR Graham
Surface Science 183 (3), 556-564, 1987
1171987
Epitaxial orientation and morphology of thin CoSi2 films grown on Si(100): Effects of growth parameters
SM Yalisove, RT Tung, D Loretto
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 7 (3 …, 1989
1031989
Medium-energy ion-scattering analysis of the Cu (110) surface
M Copel, T Gustafsson, WR Graham, SM Yalisove
Physical Review B 33 (12), 8110, 1986
841986
Evidence for a dimer reconstruction at a metal-silicon interface
D Loretto, JM Gibson, SM Yalisove
Physical review letters 63 (3), 298, 1989
821989
Effect of hydrogen on surface roughening during Si homoepitaxial growth
DP Adams, SM Yalisove, DJ Eaglesham
Applied physics letters 63 (26), 3571-3573, 1993
801993
Growth anisotropy and self-shadowing: A model for the development of in-plane texture during polycrystalline thin-film growth
OP Karpenko, JC Bilello, SM Yalisove
Journal of applied physics 82 (3), 1397-1403, 1997
761997
Analysis of thin film stress measurement techniques
SG Malhotra, ZU Rek, SM Yalisove, JC Bilello
Thin Solid Films 301 (1-2), 45-54, 1997
751997
Surface roughening during low temperature Si (100) epitaxy
OP Karpenko, SM Yalisove, DJ Eaglesham
Journal of applied physics 82 (3), 1157-1165, 1997
731997
Multilayer relaxations of Ni (110): New medium energy ion scattering results
SM Yalisove, WR Graham, ED Adams, M Copel, T Gustafsson
Surface Science 171 (2), 400-414, 1986
721986
Ion scattering study of the lithium induced reconstruction of Cu (110)
M Copel, WR Graham, T Gustafsson, S Yalisove
Solid state communications 54 (8), 695-699, 1985
711985
Pulsed laser ignition of reactive multilayer films
YN Picard, DP Adams, JA Palmer, SM Yalisove
Applied Physics Letters 88 (14), 144102, 2006
702006
Femtosecond laser ablation regimes in a single-crystal superalloy
S Ma, JP McDonald, B Tryon, SM Yalisove, TM Pollock
Metallurgical and materials transactions A 38 (13), 2349-2357, 2007
672007
Femtosecond laser machining of single-crystal superalloys through thermal barrier coatings
Q Feng, YN Picard, JP McDonald, PA Van Rompay, SM Yalisove, ...
Materials Science and Engineering: A 430 (1-2), 203-207, 2006
652006
Femtosecond pulsed laser direct write production of nano-and microfluidic channels
JP McDonald, VR Mistry, KE Ray, SM Yalisove
Applied Physics Letters 88 (18), 183113, 2006
622006
Interfacial and surface energetics of CoSi2
DP Adams, SM Yalisove, DJ Eaglesham
Journal of applied physics 76 (9), 5190-5194, 1994
561994
Nanostructured chromium nitride films with a valley of residual stress
ZB Zhao, ZU Rek, SM Yalisove, JC Bilello
Thin Solid Films 472 (1-2), 96-104, 2005
552005
Homoepitaxial growth of CoSi2 and NiSi2 on (100) and (110) surfaces at room temperature
RT Tung, F Schrey, SM Yalisove
Applied physics letters 55 (19), 2005-2007, 1989
541989
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