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Minah Lee
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Architecture, chip, and package codesign flow for interposer-based 2.5-D chiplet integration enabling heterogeneous IP reuse
J Kim, G Murali, H Park, E Qin, H Kwon, VCK Chekuri, NM Rahman, ...
IEEE Transactions on Very Large Scale Integration (VLSI) Systems 28 (11 …, 2020
792020
8.2 8Mb/s 28Mb/mJ robust true-random-number generator in 65nm CMOS based on differential ring oscillator with feedback resistors
E Kim, M Lee, JJ Kim
2017 IEEE International Solid-State Circuits Conference (ISSCC), 144-145, 2017
772017
Architecture, chip, and package co-design flow for 2.5 D IC design enabling heterogeneous IP reuse
J Kim, G Murali, H Park, E Qin, H Kwon, V Chaitanya, K Chekuri, N Dasari, ...
Proceedings of the 56th Annual Design Automation Conference 2019, 1-6, 2019
602019
Mixture of pre-processing experts model for noise robust deep learning on resource constrained platforms
T Na, M Lee, BA Mudassar, P Saha, JH Ko, S Mukhopadhyay
2019 International Joint Conference on Neural Networks (IJCNN), 1-7, 2019
182019
Afe-cim: A current-domain compute-in-memory macro for analog-to-feature extraction
S Sharma, WC Wang, C DeLude, M Lee, NM Rahman, NV Kidambi, ...
ESSCIRC 2023-IEEE 49th European Solid State Circuits Conference (ESSCIRC), 33-36, 2023
102023
Effect of process variations in digital pixel circuits on the accuracy of DNN based smart sensor
M Lee, M Mukherjee, P Saha, MF Amir, T Na, S Mukhopadhyay
2020 2nd IEEE International Conference on Artificial Intelligence Circuits …, 2020
82020
Reliable edge intelligence in unreliable environment
M Lee, X She, B Chakraborty, S Dash, B Mudassar, S Mukhopadhyay
2021 Design, Automation & Test in Europe Conference & Exhibition (DATE), 896-901, 2021
62021
Algorithm-circuit cross-layer control for digital pixel image sensors
M Mukherjee, BA Mudassar, M Lee, S Mukhopadhyay
2020 IEEE SENSORS, 1-4, 2020
62020
Automated generation of all-digital I/0 library cells for system-in-package integration of multiple dies
M Lee, A Singh, HM Torun, J Kim, S Lim, M Swaminathan, ...
2018 IEEE 27th Conference on Electrical Performance of Electronic Packaging …, 2018
62018
Warningnet: A deep learning platform for early warning of task failures under input perturbation for reliable autonomous platforms
M Lee, B Mudassar, T Na, S Mukhopadhyay
2020 57th ACM/IEEE Design Automation Conference (DAC), 1-6, 2020
42020
A Spatiotemporal Pre-processing Network for Activity Recognition under Rain
M Lee, B Mudassar, T Na, S Mukhopadhyay
42019
Learning Locally Interacting Discrete Dynamical Systems: Towards Data-Efficient and Scalable Prediction
B Kang, H Kumar, M Lee, B Chakraborty, S Mukhopadhyay
arXiv preprint arXiv:2404.06460, 2024
32024
Cool-cim: Cryogenic operation of analog compute-in-memory for improved power-efficiency
WC Wang, R Saligram, S Sharma, M Lee, A Gaidhane, Y Cao, ...
2023 International Electron Devices Meeting (IEDM), 1-4, 2023
32023
Adaptive Camera Platform Using Deep Learning-Based Early Warning of Task Failures
M Lee, BA Mudassar, S Mukhopadhyay
IEEE Sensors Journal 21 (12), 13794-13804, 2021
32021
Cross-layer noise analysis in smart digital pixel sensors with integrated deep neural network
M Lee, M Mukherjee, E Lee, P Saha, MF Amir, T Na, S Mukhopadhyay
IEEE Journal on Emerging and Selected Topics in Circuits and Systems 10 (4 …, 2020
32020
Automated I/O library generation for interposer-based system-in-package integration of multiple heterogeneous dies
M Lee, A Singh, HM Torun, J Kim, SK Lim, M Swaminathan, ...
IEEE Transactions on Components, Packaging and Manufacturing Technology 10 …, 2019
32019
Energy-efficient sensor platform using reliable analog-to-feature extraction
M Lee, S Sharma, WC Wang, S Mukhopadhyay
2023 IEEE SENSORS, 1-4, 2023
12023
CLUE: Cross-Layer Uncertainty Estimator for Reliable Neural Perception using Processing-in-Memory Accelerators
M Lee, A Lu, M Mukherjee, S Yu, S Mukhopadhyay
2023 International Joint Conference on Neural Networks (IJCNN), 01-08, 2023
12023
Forecasting Local Behavior of Self-organizing Many-agent System without Reconstruction
B Kang, M Lee, H Kumar, S Mukhopadhyay
arXiv preprint arXiv:2210.17289, 2022
12022
Lightweight Model Uncertainty Estimation for Deep Neural Object Detection
M Lee, B Mudassar, S Mukhopadhyay
2022 International Joint Conference on Neural Networks (IJCNN), 1-8, 2022
12022
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