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JaeHwang Jung
JaeHwang Jung
Staff Engineer, MI Equipment Development Team, Mechatronics Research, Samsung Electronics
samsung.com의 이메일 확인됨
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Quantitative phase imaging techniques for the study of cell pathophysiology: from principles to applications
KR Lee, K Kim, J Jung, JH Heo, S Cho, S Lee, G Chang, YJ Jo, H Park, ...
Sensors 13 (4), 4170-4191, 2013
5192013
Holographic deep learning for rapid optical screening of anthrax spores
YJ Jo, S Park, JH Jung, J Yoon, H Joo, M Kim, SJ Kang, MC Choi, SY Lee, ...
Science advances 3 (8), e1700606, 2017
1822017
Hyperspectral optical diffraction tomography
JH Jung, K Kim, J Yoon, YK Park
Optics express 24 (3), 2006-2012, 2016
862016
Label-free optical quantification of structural alterations in Alzheimer’s disease
M Lee, E Lee, JH Jung, H Yu, K Kim, J Yoon, S Lee, Y Jeong, YK Park
Scientific reports 6 (1), 31034, 2016
802016
Label-free non-invasive quantitative measurement of lipid contents in individual microalgal cells using refractive index tomography
JH Jung, SJ Hong, HB Kim, G Kim, M Lee, S Shin, SY Lee, DJ Kim, ...
Scientific reports 8 (1), 6524, 2018
772018
Label-free identification of individual bacteria using Fourier transform light scattering
YJ Jo, JH Jung, M Kim, HJ Park, SJ Kang, YK Park
Optics express 23 (12), 15792-15805, 2015
762015
Angle-resolved light scattering of individual rod-shaped bacteria based on Fourier transform light scattering
YJ Jo, JH Jung, JW Lee, D Shin, HJ Park, KT Nam, JH Park, YK Park
Scientific reports 4 (1), 5090, 2014
622014
Spectro-refractometry of individual microscopic objects using swept-source quantitative phase imaging
JH Jung, J Jang, YK Park
Analytical chemistry 85 (21), 10519-10525, 2013
562013
Biomedical applications of holographic microspectroscopy
JH Jung, K Kim, HS Yu, KR Lee, SE Lee, SH Nahm, HJ Park, YK Park
Applied optics 53 (27), G111-G122, 2014
522014
Optical characterization of red blood cells from individuals with sickle cell trait and disease in Tanzania using quantitative phase imaging
JH Jung, LE Matemba, KR Lee, PE Kazyoba, J Yoon, JJ Massaga, K Kim, ...
Scientific reports 6 (1), 31698, 2016
432016
Three-dimensional label-free observation of individual bacteria upon antibiotic treatment using optical diffraction tomography
J Oh, JS Ryu, M Lee, J Jung, SY Han, HJ Chung, Y Park
Biomedical optics express 11 (3), 1257-1267, 2020
422020
T cells sense biophysical cues using lamellipodia and filopodia to optimize intraluminal path finding
KH Song, KW Kwon, JC Choi, JH Jung, YK Park, KY Suh, J Doh
Integrative biology 6 (4), 450-459, 2014
282014
Focus: medical technology: combining three-dimensional quantitative phase imaging and fluorescence microscopy for the study of cell pathophysiology
YS Kim, SY Lee, JH Jung, S Shin, HG Choi, GH Cha, W Park, S Lee, ...
The Yale Journal of Biology and Medicine 91 (3), 267, 2018
262018
Spectro-angular light scattering measurements of individual microscopic objects
JH Jung, YK Park
Optics express 22 (4), 4108-4114, 2014
262014
Three-dimensional label-free visualization and quantification of polyhydroxyalkanoates in individual bacterial cell in its native state
SY Choi, J Oh, JH Jung, YK Park, SY Lee
Proceedings of the National Academy of Sciences 118 (31), e2103956118, 2021
192021
Measurements of polarization-dependent angle-resolved light scattering from individual microscopic samples using Fourier transform light scattering
JH Jung, J Kim, MK Seo, YK Park
Optics Express 26 (6), 7701-7711, 2018
132018
Measurements of complex refractive index change of photoactive yellow protein over a wide wavelength range using hyperspectral quantitative phase imaging
KR Lee, Y Kim, JH Jung, H Ihee, YK Park
Scientific reports 8 (1), 3064, 2018
112018
Multi spectral holographic ellipsometry for a complex 3D nanostructure
J Jung, W Kim, J Kim, S Lee, I Shin, C Yoon, S Jeong, Y Hidaka, ...
Optics Express 30 (26), 46956-46971, 2022
72022
A breakthrough on throughput and accuracy limitation in ellipsometry using self-interference holographic analysis
J Jung, Y Hidaka, J Kim, M Numata, W Kim, S Ueyama, M Lee
Metrology, Inspection, and Process Control for Semiconductor Manufacturing …, 2021
62021
A new approach in optical metrology with multi-angle information through self-interferometric ellipsometry
W Kim, J Jung, J Kim, I Shin, N Kim, M Lee
Applied Optical Metrology IV 11817, 26-33, 2021
42021
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학술자료 1–20