팔로우
JaeHwang Jung
JaeHwang Jung
Staff Engineer, MI Equipment Development Team, Mechatronics Research, Samsung Electronics
samsung.com의 이메일 확인됨
제목
인용
인용
연도
Quantitative phase imaging techniques for the study of cell pathophysiology: from principles to applications
KR Lee, K Kim, J Jung, JH Heo, S Cho, S Lee, G Chang, YJ Jo, H Park, ...
Sensors 13 (4), 4170-4191, 2013
5132013
Holographic deep learning for rapid optical screening of anthrax spores
YJ Jo, S Park, JH Jung, J Yoon, H Joo, M Kim, SJ Kang, MC Choi, SY Lee, ...
Science advances 3 (8), e1700606, 2017
1802017
Hyperspectral optical diffraction tomography
JH Jung, K Kim, J Yoon, YK Park
Optics express 24 (3), 2006-2012, 2016
842016
Label-free optical quantification of structural alterations in Alzheimer’s disease
M Lee, E Lee, JH Jung, H Yu, K Kim, J Yoon, S Lee, Y Jeong, YK Park
Scientific reports 6 (1), 31034, 2016
802016
Label-free non-invasive quantitative measurement of lipid contents in individual microalgal cells using refractive index tomography
JH Jung, SJ Hong, HB Kim, G Kim, M Lee, S Shin, SY Lee, DJ Kim, ...
Scientific reports 8 (1), 6524, 2018
772018
Label-free identification of individual bacteria using Fourier transform light scattering
YJ Jo, JH Jung, M Kim, HJ Park, SJ Kang, YK Park
Optics express 23 (12), 15792-15805, 2015
762015
Angle-resolved light scattering of individual rod-shaped bacteria based on Fourier transform light scattering
YJ Jo, JH Jung, JW Lee, D Shin, HJ Park, KT Nam, JH Park, YK Park
Scientific reports 4 (1), 5090, 2014
622014
Spectro-refractometry of individual microscopic objects using swept-source quantitative phase imaging
JH Jung, J Jang, YK Park
Analytical chemistry 85 (21), 10519-10525, 2013
562013
Biomedical applications of holographic microspectroscopy
JH Jung, K Kim, HS Yu, KR Lee, SE Lee, SH Nahm, HJ Park, YK Park
Applied optics 53 (27), G111-G122, 2014
522014
Optical characterization of red blood cells from individuals with sickle cell trait and disease in Tanzania using quantitative phase imaging
JH Jung, LE Matemba, KR Lee, PE Kazyoba, J Yoon, JJ Massaga, K Kim, ...
Scientific reports 6 (1), 31698, 2016
432016
Three-dimensional label-free observation of individual bacteria upon antibiotic treatment using optical diffraction tomography
J Oh, JS Ryu, M Lee, J Jung, SY Han, HJ Chung, Y Park
Biomedical optics express 11 (3), 1257-1267, 2020
422020
T cells sense biophysical cues using lamellipodia and filopodia to optimize intraluminal path finding
KH Song, KW Kwon, JC Choi, JH Jung, YK Park, KY Suh, J Doh
Integrative biology 6 (4), 450-459, 2014
282014
Focus: medical technology: combining three-dimensional quantitative phase imaging and fluorescence microscopy for the study of cell pathophysiology
YS Kim, SY Lee, JH Jung, S Shin, HG Choi, GH Cha, W Park, S Lee, ...
The Yale Journal of Biology and Medicine 91 (3), 267, 2018
262018
Spectro-angular light scattering measurements of individual microscopic objects
JH Jung, YK Park
Optics express 22 (4), 4108-4114, 2014
262014
Three-dimensional label-free visualization and quantification of polyhydroxyalkanoates in individual bacterial cell in its native state
SY Choi, J Oh, JH Jung, YK Park, SY Lee
Proceedings of the National Academy of Sciences 118 (31), e2103956118, 2021
182021
Measurements of polarization-dependent angle-resolved light scattering from individual microscopic samples using Fourier transform light scattering
JH Jung, J Kim, MK Seo, YK Park
Optics Express 26 (6), 7701-7711, 2018
132018
Measurements of complex refractive index change of photoactive yellow protein over a wide wavelength range using hyperspectral quantitative phase imaging
KR Lee, Y Kim, JH Jung, H Ihee, YK Park
Scientific reports 8 (1), 3064, 2018
112018
Multi spectral holographic ellipsometry for a complex 3D nanostructure
J Jung, W Kim, J Kim, S Lee, I Shin, C Yoon, S Jeong, Y Hidaka, ...
Optics Express 30 (26), 46956-46971, 2022
72022
A breakthrough on throughput and accuracy limitation in ellipsometry using self-interference holographic analysis
J Jung, Y Hidaka, J Kim, M Numata, W Kim, S Ueyama, M Lee
Metrology, Inspection, and Process Control for Semiconductor Manufacturing …, 2021
62021
A new approach in optical metrology with multi-angle information through self-interferometric ellipsometry
W Kim, J Jung, J Kim, I Shin, N Kim, M Lee
Applied Optical Metrology IV 11817, 26-33, 2021
42021
현재 시스템이 작동되지 않습니다. 나중에 다시 시도해 주세요.
학술자료 1–20