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Hunsik Shin
Hunsik Shin
Samsung Advanced Institute of Technology (SAIT)
Verified email at samsung.com
Title
Cited by
Cited by
Year
Champion-challenger analysis for credit card fraud detection: Hybrid ensemble and deep learning
E Kim, J Lee, H Shin, H Yang, S Cho, S Nam, Y Song, J Yoon, J Kim
Expert Systems with Applications 128, 214-224, 2019
1312019
A medical treatment based scoring model to detect abusive institutions
J Lee, H Shin, S Cho
Journal of Biomedical Informatics 107, 103423, 2020
92020
The effect of font and display sizes on the readability for mobile devices
M Kim, SH Ahn, Y Kang, S Jee, S Kim, JH Park, H Shin, MH Yun
Proceedings of HCI Korea, 468-475, 2016
72016
General-use unsupervised keyword extraction model for keyword analysis
H Shin, HJ Lee, S Cho
Expert Systems with Applications, 120889, 2023
52023
A scoring model to detect abusive medical institutions based on patient classification system: Diagnosis-related group and ambulatory patient group
H Shin, J Lee, Y An, S Cho
Journal of Biomedical Informatics 117, 103752, 2021
32021
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Articles 1–5