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Donghwan Shin
Donghwan Shin
Lecturer (Assistant Professor), University of Sheffield
Verified email at sheffield.ac.uk - Homepage
Title
Cited by
Cited by
Year
Are mutation scores correlated with real fault detection? a large scale empirical study on the relationship between mutants and real faults
M Papadakis, D Shin, S Yoo, DH Bae
Proceedings of the 40th International Conference on Software Engineering ・, 2018
1242018
Comparing offline and online testing of deep neural networks: An autonomous car case study
FU Haq, D Shin, S Nejati, LC Briand
2020 IEEE 13th International Conference on Software Testing, Validation and ・, 2020
502020
Automated test case generation for FBD programs implementing reactor protection system software
E Jee, D Shin, S Cha, JS Lee, DH Bae
Software Testing, Verification and Reliability 24 (8), 608-628, 2014
482014
Empirical evaluation of mutation‐based test case prioritization techniques
D Shin, S Yoo, M Papadakis, DH Bae
Software Testing, Verification and Reliability 29 (1-2), e1695, 2019
442019
Efficient online testing for DNN-enabled systems using surrogate-assisted and many-objective optimization
FU Haq, D Shin, L Briand
Proceedings of the 44th international conference on software engineering ・, 2022
382022
A theoretical and empirical study of diversity-aware mutation adequacy criterion
D Shin, S Yoo, DH Bae
IEEE Transactions on Software Engineering 44 (10), 914-931, 2017
372017
A theoretical framework for understanding mutation-based testing methods
D Shin, DH Bae
2016 IEEE International Conference on Software Testing, Verification and ・, 2016
332016
Formal modeling and verification of a federated byzantine agreement algorithm for blockchain platforms
J Yoo, Y Jung, D Shin, M Bae, E Jee
2019 IEEE International Workshop on Blockchain Oriented Software Engineering ・, 2019
302019
Empirical evaluation on FBD model-based test coverage criteria using mutation analysis
D Shin, E Jee, DH Bae
Model Driven Engineering Languages and Systems: 15th International ・, 2012
302012
Digital twins are not monozygotic–cross-replicating adas testing in two industry-grade automotive simulators
M Borg, RB Abdessalem, S Nejati, FX Jegeden, D Shin
2021 14th IEEE Conference on Software Testing, Verification and Validation ・, 2021
282021
Can Offline Testing of Deep Neural Networks Replace Their Online Testing?
FU Haq, D Shin, S Nejati, L Briand
Empirical Software Engineering 26 (5), 1-30, 2021
25*2021
Human resource allocation in software project with practical considerations
J Park, D Seo, G Hong, D Shin, J Hwa, DH Bae
International Journal of Software Engineering and Knowledge Engineering 25 ・, 2015
252015
Modeling and verification for different types of system of systems using prism
D Seo, D Shin, YM Baek, J Song, W Yun, J Kim, E Jee, DH Bae
Proceedings of the 4th International Workshop on Software Engineering for ・, 2016
242016
Comprehensive analysis of FBD test coverage criteria using mutants
D Shin, E Jee, DH Bae
Software & Systems Modeling 15 (3), 631-645, 2016
192016
Practical Human Resource Allocation in Software Projects Using Genetic Algorithm
J Park, D Seo, G Hong, D Shin, J Hwa, DH Bae
182014
Guidelines for assessing the accuracy of log message template identification techniques
ZA Khan, D Shin, D Bianculli, L Briand
Proceedings of the 44th International Conference on Software Engineering ・, 2022
172022
Automatic test suite generation for key-points detection DNNs using many-objective search (experience paper)
FU Haq, D Shin, LC Briand, T Stifter, J Wang
Proceedings of the 30th ACM SIGSOFT International Symposium on Software ・, 2021
162021
A runtime verification framework for dynamically adaptive multi-agent systems
YJ Lim, G Hong, D Shin, E Jee, DH Bae
2016 International Conference on Big Data and Smart Computing (BigComp), 509-512, 2016
162016
Log-based slicing for system-level test cases
S Messaoudi, D Shin, A Panichella, D Bianculli, LC Briand
Proceedings of the 30th ACM SIGSOFT international symposium on software ・, 2021
132021
Diversity-Aware Mutation Adequacy Criterion for Improving Fault Detection Capability
D Shin, S Yoo, DH Bae
2016 IEEE Ninth International Conference on Software Testing, Verification ・, 2016
132016
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