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Co-authors
- Ruoxue YanUniversity of California, RiversideVerified email at engr.ucr.edu
- Yangzhi ZhuAssistant Professor, Terasaki Research Institute, UCSD, UCR, DUTVerified email at terasaki.org
- Xuezhi MaScientist, Institute of Materials Research and Engineering (IMRE) at A*STARVerified email at ucr.edu
- Qiushi LiuPh.D of Electrical EngineeringVerified email at ucr.edu
- Ming LiuUniversity of California - RiversideVerified email at ece.ucr.edu
- Sanggon KimPhD, Laval UniversityVerified email at ulaval.ca
- Da XuPhD Student, University of California, RiversideVerified email at ucr.edu
- Junming Sun (孙军明)ClariantVerified email at clariant.com
- Yong WangWashington State University, Pacific Northwest National LaboratoryVerified email at wsu.edu
- He (Helen) ZhangClariantVerified email at clariant.com