Cristian Zambelli
Cristian Zambelli
Assistant Professor, University of Ferrara
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Fundamental variability limits of filament-based RRAM
A Grossi, E Nowak, C Zambelli, C Pellissier, S Bernasconi, G Cibrario, ...
2016 IEEE International Electron Devices Meeting (IEDM), 4.7. 1-4.7. 4, 2016
Impact of intercell and intracell variability on forming and switching parameters in RRAM arrays
A Grossi, D Walczyk, C Zambelli, E Miranda, P Olivo, V Stikanov, A Feriani, ...
IEEE Transactions on Electron Devices 62 (8), 2502-2509, 2015
Multilevel HfO2-based RRAM devices for low-power neuromorphic networks
V Milo, C Zambelli, P Olivo, E Pérez, M K. Mahadevaiah, O G. Ossorio, ...
APL Materials 7 (8), 081120, 2019
Electrical characterization and modeling of pulse-based forming techniques in RRAM arrays
A Grossi, C Zambelli, P Olivo, E Miranda, V Stikanov, C Walczyk, ...
Solid-State Electronics 115, 17-25, 2016
Nonvolatile memories: Present and future challenges
EI Vatajelu, H Aziza, C Zambelli
2014 9th International Design and Test Symposium (IDT), 61-66, 2014
Reduction of the Cell-to-Cell Variability in Hf1-xAlxOyBased RRAM Arrays by Using Program Algorithms
E Pérez, A Grossi, C Zambelli, P Olivo, R Roelofs, C Wenger
IEEE Electron Device Letters 38 (2), 175-178, 2016
Experimental investigation of 4-kb RRAM arrays programming conditions suitable for TCAM
A Grossi, E Vianello, C Zambelli, P Royer, JP Noel, B Giraud, L Perniola, ...
IEEE Transactions on Very Large Scale Integration (VLSI) Systems 26 (12 …, 2018
Architectural and integration options for 3D NAND flash memories
R Micheloni, L Crippa, C Zambelli, P Olivo
Computers 6 (3), 27, 2017
Solid-state drives: Memory driven design methodologies for optimal performance
L Zuolo, C Zambelli, R Micheloni, P Olivo
Proceedings of the IEEE 105 (9), 1589-1608, 2017
A cross-layer approach for new reliability-performance trade-offs in MLC NAND flash memories
C Zambelli, M Indaco, M Fabiano, S Di Carlo, P Prinetto, P Olivo, ...
2012 Design, Automation & Test in Europe Conference & Exhibition (DATE), 881-886, 2012
Statistical analysis of resistive switching characteristics in ReRAM test arrays
C Zambelli, A Grossi, P Olivo, D Walczyk, T Bertaud, B Tillack, ...
2014 International Conference on Microelectronic Test Structures (ICMTS), 27-31, 2014
SSDExplorer: A virtual platform for performance/reliability-oriented fine-grained design space exploration of solid state drives
L Zuolo, C Zambelli, R Micheloni, M Indaco, S Di Carlo, P Prinetto, ...
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2015
Is consumer electronics redesigning our cars?: Challenges of integrated technologies for sensing, computing, and storage
F Pieri, C Zambelli, A Nannini, P Olivo, S Saponara
IEEE Consumer Electronics Magazine 7 (5), 8-17, 2018
Relationship among current fluctuations during forming, cell-to-cell variability and reliability in RRAM arrays
A Grossi, C Zambelli, P Olivo, E Miranda, V Stikanov, T Schroeder, ...
2015 IEEE International Memory Workshop (IMW), 1-4, 2015
Resistive RAM endurance: Array-level characterization and correction techniques targeting deep learning applications
A Grossi, E Vianello, MM Sabry, M Barlas, L Grenouillet, J Coignus, ...
IEEE Transactions on Electron Devices 66 (3), 1281-1288, 2019
Reliability and performance characterization of a MEMS-based non-volatile switch
R Gaddi, C Schepens, C Smith, C Zambelli, A Chimenton, P Olivo
2011 International Reliability Physics Symposium, 2G. 2.1-2G. 2.6, 2011
Toward reliable multi-level operation in RRAM arrays: Improving post-algorithm stability and assessing endurance/data retention
E Perez, C Zambelli, MK Mahadevaiah, P Olivo, C Wenger
IEEE Journal of the Electron Devices Society 7, 740-747, 2019
Characterization of TLC 3D-NAND flash endurance through machine learning for LDPC code rate optimization
C Zambelli, G Cancelliere, F Riguzzi, E Lamma, P Olivo, A Marelli, ...
2017 IEEE International Memory Workshop (IMW), 1-4, 2017
Reliability of 3D NAND flash memories
A Grossi, C Zambelli, P Olivo
3D Flash Memories, 29-62, 2016
Phase change and magnetic memories for solid-state drive applications
C Zambelli, G Navarro, V Sousa, IL Prejbeanu, L Perniola
Proceedings of the IEEE 105 (9), 1790-1811, 2017
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