Frédéric Darracq
Frédéric Darracq
Associate professor, Bordeaux university
Verified email at ims-bordeaux.fr
Title
Cited by
Cited by
Year
Backside SEU laser testing for commercial off-the-shelf SRAMs
F Darracq, H Lapuyade, N Buard, F Mounsi, B Foucher, P Fouillat, ...
IEEE Transactions on Nuclear Science 49 (6), 2977-2983, 2002
752002
Influence of laser pulse duration in single event upset testing
A Douin, V Pouget, F Darracq, D Lewis, P Fouillat, P Perdu
2005 8th European Conference on Radiation and Its Effects on Components and …, 2005
662005
Terahertz imaging and tomography as efficient instruments for testing polymer additive manufacturing objects
JB Perraud, AF Obaton, J Bou-Sleiman, B Recur, H Balacey, F Darracq, ...
Applied optics 55 (13), 3462-3467, 2016
382016
Investigation on the SEL sensitive depth of an SRAM using linear and two-photon absorption laser testing
E Faraud, V Pouget, K Shao, C Larue, F Darracq, D Lewis, A Samaras, ...
IEEE Transactions on Nuclear Science 58 (6), 2637-2643, 2011
352011
Laser cross section measurement for the evaluation of single-event effects in integrated circuits
V Pouget, P Fouillat, D Lewis, H Lapuyade, F Darracq, A Touboul
Microelectronics Reliability 40 (8-10), 1371-1375, 2000
332000
Art painting diagnostic before restoration with terahertz and millimeter waves
JP Guillet, M Roux, K Wang, X Ma, F Fauquet, H Balacey, B Recur, ...
Journal of Infrared, Millimeter, and Terahertz Waves 38 (4), 369-379, 2017
302017
Evaluation of recent technologies of non-volatile RAM
T Nuns, S Duzellier, J Bertrand, G Hubert, V Pouget, F Darracq, JP David, ...
2007 9th European Conference on Radiation and Its Effects on Components and …, 2007
252007
Fundamentals of the pulsed laser technique for single-event upset testing
P Fouillat, V Pouget, D McMorrow, F Darracq, S Buchner, D Lewis
Radiation Effects on Embedded Systems, 121-141, 2007
242007
Single-event sensitivity of a single SRAM cell
F Darracq, T Beauchene, V Pouget, H Lapuyade, D Lewis, P Fouillat, ...
IEEE Transactions on Nuclear Science 49 (3), 1486-1490, 2002
242002
THE HARDNESS-INTENSITY CORRELATION IN BRIGHT GAMMA-RAY BURSTS
AK J.-P. Dezalay, J.-L. Atteia, C. Barat, M. Boer, F. Darracq, P. Goupil, M ...
The Astrophysical Journal 490 (1), L17-L20, 1997
23*1997
Low-frequency noise effect on terahertz tomography using thermal detectors
JP Guillet, B Recur, H Balacey, JB Sleiman, F Darracq, D Lewis, ...
Applied optics 54 (22), 6758-6762, 2015
132015
Investigation of single event burnout sensitive depth in power MOSFETS
F Darracq, V Pouget, D Lewis, P Fouillat, E Lorfevre, R Ecoffet, F Bezerra
2009 European Conference on Radiation and Its Effects on Components and …, 2009
132009
TCAD simulation capabilities towards gate leakage current analysis of advanced AlGaN/GaN HEMT devices
K Mukherjee, F Darracq, A Curutchet, N Malbert, N Labat
Microelectronics Reliability 76, 350-356, 2017
122017
Characterization and modeling of laser-induced single-event burn-out in SiC power diodes
N Mbaye, V Pouget, F Darracq, D Lewis
Microelectronics Reliability 53 (9-11), 1315-1319, 2013
112013
Impact of negative bias temperature instability on the single-event upset threshold of a 65 nm SRAM cell
I El Moukhtari, V Pouget, C Larue, F Darracq, D Lewis, P Perdu
Microelectronics Reliability 53 (9-11), 1325-1328, 2013
112013
Investigation on the single event burnout sensitive volume using two-photon absorption laser testing
F Darracq, N Mbaye, S Azzopardi, V Pouget, E Lorfevre, F Bezerra, ...
IEEE Transactions on Nuclear Science 59 (4), 999-1006, 2012
112012
Optimizing pulsed OBIC technique for ESD defect localization
F Essely, N Guitard, F Darracq, V Pouget, M Bafleur, P Perdu, A Touboul, ...
IEEE Transactions on Device and Materials Reliability 7 (4), 617-624, 2007
112007
A non-linear model to express laser-induced SRAM cross-sections versus an effective laser LET
F Darracq, H Lapuyade, V Pouget, P Fouillat
ESA Special Publication 536, 107, 2004
102004
Imaging the single event burnout sensitive volume of vertical power MOSFETs using the laser two-photon absorption technique
F Darracq, N Mbaye, C Larue, V Pouget, S Azzopardi, E Lorfevre, ...
2011 12th European Conference on Radiation and Its Effects on Components and …, 2011
92011
Application of various optical techniques for ESD defect localization
F Essely, F Darracq, V Pouget, M Remmach, F Beaudoin, N Guitard, ...
Microelectronics Reliability 46 (9-11), 1563-1568, 2006
92006
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