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Co-authors
- Mokter Mahmud ChowdhuryUniversity of British Columbia, Bangladesh University of Engineering and TechnologyVerified email at ece.ubc.ca
- Uday SahaUniversity of MarylandVerified email at terpmail.umd.edu
- Quazi D. M. KhosruBangladesh University of Engineering and TechnologyVerified email at eee.buet.ac.bd
- Sumaiya WahidPhD Student, Electrical Engineering, Stanford UniversityVerified email at stanford.edu
- Parham YaghoobiProduct Development Manager, EUV Technology, ASML, Veldhoven, The NetherlandsVerified email at ece.ubc.ca
- Navid Anjum AaditPhD Candidate, University of California, Santa BarbaraVerified email at ucsb.edu
- Sharadindu Gopal KirtaniaPhD Student, Georgia Institute of TechnologyVerified email at gatech.edu
- Mohammad Mushfiqur RahmanUniversity of Maryland, National Institute of Standards and TechnologyVerified email at umd.edu
- Farhana AfrinPhD Candidate, Boise State UniversityVerified email at u.boisestate.edu
- Faysal HakimTexas InstrumentsVerified email at ufl.edu
- Nadim ChowdhuryMIT, EECSVerified email at mit.edu
- MD SADMAN SAKIB RAHMANGraduate Student Researcher, UCLAVerified email at g.ucla.edu
- Shoaib MahmudPhD Student, Purdue UniversityVerified email at purdue.edu
- Orchi HassanBangladesh University of Engineering and TechnologyVerified email at eee.buet.ac.bd
- Nael Mizanur RahmanMicron TechnologyVerified email at micron.com
- Mohammad AdnaanPhD, Georgia Institute of TechnologyVerified email at gatech.edu
- Dimitri AdhikaryGraduate, Georgia Institute of TechnologyVerified email at gatech.edu
- Golam RabbaniSystem and SW Optimization Engineer, Intel Corp.Verified email at intel.com
- Tomás PalaciosMITVerified email at mit.edu
- Shafayeth JamilUniversity of Southern CaliforniaVerified email at usc.edu