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Young Jun CHANG
Young Jun CHANG
Professor of Physics, University of Seoul
Verified email at uos.ac.kr - Homepage
Title
Cited by
Cited by
Year
Polarization relaxation induced by a depolarization field in ultrathin ferroelectric BaTiO 3 capacitors
DJ Kim, JY Jo, YS Kim, YJ Chang, JS Lee, JG Yoon, TK Song, TW Noh
Physical review letters 95 (23), 237602, 2005
4172005
Tunable polaronic conduction in anatase TiO2
S Moser, L Moreschini, J Jacimovic, OS Barisic, H Berger, A Magrez, ...
http://prl.aps.org/abstract/PRL/v110/i19/e196403, 2013
3062013
Critical thickness of ultrathin ferroelectric BaTiO3 films
YS Kim, DH Kim, JD Kim, YJ Chang, TW Noh, JH Kong, K Char, YD Park, ...
Applied Physics Letters 86 (10), 102907-103100, 2005
2892005
Electronic structure of graphene on single-crystal copper substrates
AL Walter, S Nie, A Bostwick, KS Kim, L Moreschini, YJ Chang, ...
Physical Review B—Condensed Matter and Materials Physics 84 (19), 195443, 2011
2762011
Emergence of a Metal–Insulator Transition and High-Temperature Charge-Density Waves in VSe2 at the Monolayer Limit
G Duvjir, BK Choi, I Jang, S Ulstrup, S Kang, T Thi Ly, S Kim, YH Choi, ...
Nano letters 18 (9), 5432-5438, 2018
2192018
Giant Ambipolar Rashba Effect in the Semiconductor BiTeI
A Crepaldi, L Moreschini, G Autès, C Tournier-Colletta, S Moser, N Virk, ...
Physical Review Letters 109 (9), 096803, 2012
2072012
Fundamental thickness limit of itinerant ferromagnetic SrRuO 3 thin films
YJ Chang, CH Kim, SH Phark, YS Kim, J Yu, TW Noh
Physical review letters 103 (5), 057201, 2009
1892009
Highly p-doped epitaxial graphene obtained by fluorine intercalation
AL Walter, KJ Jeon, A Bostwick, F Speck, M Ostler, T Seyller, L Moreschini, ...
Applied Physics Letters 98 (18), 2011
1812011
Thickness-dependent structural phase transition of strained SrRuO ultrathin films: The role of octahedral tilt
SH Chang, YJ Chang, SY Jang, DW Jeong, CU Jung, YJ Kim, JS Chung, ...
Physical Review B—Condensed Matter and Materials Physics 84 (10), 104101, 2011
1602011
Structure and correlation effects in semiconducting
YJ Chang, A Bostwick, YS Kim, K Horn, E Rotenberg
Physical Review B—Condensed Matter and Materials Physics 81 (23), 235109, 2010
1522010
Localized electronic states induced by defects and possible origin of ferroelectricity in strontium titanate thin films
YS Kim, J Kim, SJ Moon, WS Choi, YJ Chang, JG Yoon, J Yu, JS Chung, ...
Applied Physics Letters 94 (20), 2009
1182009
Effective screening and the plasmaron bands in graphene
AL Walter, A Bostwick, KJ Jeon, F Speck, M Ostler, T Seyller, L Moreschini, ...
Physical Review B—Condensed Matter and Materials Physics 84 (8), 085410, 2011
1132011
Electronic Structure of the Kitaev Material α-RuCl3 Probed by Photoemission and Inverse Photoemission Spectroscopies
S Sinn, CH Kim, BH Kim, KD Lee, CJ Won, JS Oh, M Han, YJ Chang, ...
Scientific reports 6 (1), 39544, 2016
932016
Ferroelectric properties of SrRuO3∕ BaTiO3∕ SrRuO3 ultrathin film capacitors free from passive layers
YS Kim, JY Jo, DJ Kim, YJ Chang, JH Lee, TW Noh, TK Song, JG Yoon, ...
Applied physics letters 88 (7), 2006
912006
Long-term stability study of graphene-passivated black phosphorus under air exposure
J Kim, SK Baek, KS Kim, YJ Chang, EJ Choi
Current Applied Physics 16 (2), 165-169, 2016
852016
Phase coexistence in the metal–insulator transition of a VO2 thin film
YJ Chang, CH Koo, JS Yang, YS Kim, DH Kim, JS Lee, TW Noh, HT Kim, ...
Thin Solid Films 486 (1-2), 46-49, 2005
822005
Angle-resolved photoemission and quasiparticle calculation of ZnO: The need for band shift in oxide semiconductors
LY Lim, S Lany, YJ Chang, E Rotenberg, A Zunger, MF Toney
Physical Review B—Condensed Matter and Materials Physics 86 (23), 235113, 2012
782012
Kinetic roughening of ion-sputtered Pd (001) surface: beyond the Kuramoto-Sivashinsky model
TC Kim, CM Ghim, HJ Kim, DH Kim, DY Noh, ND Kim, JW Chung, ...
Physical review letters 92 (24), 246104, 2004
772004
Surface versus bulk characterizations of electronic inhomogeneity in a thin film
YJ Chang, JS Yang, YS Kim, DH Kim, TW Noh, DW Kim, E Oh, B Kahng, ...
Physical Review B—Condensed Matter and Materials Physics 76 (7), 075118, 2007
762007
Role of oxygen vacancy in HfO2/SiO2/Si (100) interfaces
DY Cho, SJ Oh, YJ Chang, TW Noh, R Jung, JC Lee
Applied physics letters 88 (19), 193502, 2006
762006
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