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Sadman Sakib
제목
인용
인용
연도
Independent detection of recycled flash memory: Challenges and solutions
P Kumari, BMSB Talukder, S Sakib, B Ray, MT Rahman
2018 IEEE International Symposium on Hardware Oriented Security and Trust …, 2018
252018
An aging-resistant NAND flash memory physical unclonable function
S Sakib, A Milenković, MT Rahman, B Ray
IEEE Transactions on Electron Devices 67 (3), 937-943, 2020
202020
Non-invasive detection method for recycled flash memory using timing characteristics
S Sakib, P Kumari, BMSB Talukder, MT Rahman, B Ray
Cryptography 2 (3), 17, 2018
202018
Flash watermark: An anticounterfeiting technique for NAND flash memories
S Sakib, A Milenković, B Ray
IEEE Transactions on Electron Devices 67 (10), 4172-4177, 2020
82020
Flash memory based physical unclonable function
S Sakib, MT Rahman, A Milenković, B Ray
2019 SoutheastCon, 1-6, 2019
82019
Total ionizing dose effects on physical unclonable function from NAND flash memory
S Sakib, M Raquibuzzaman, M Wasiolek, K Hattar, B Ray
IEEE Transactions on Nuclear Science 68 (7), 1445-1453, 2021
52021
A shared page-aware machine learning assisted method for predicting and improving multi-level cell NAND flash memory life expectancy
P Santikellur, M Buddhanoy, S Sakib, B Ray, RS Chakraborty
Microelectronics Reliability 140, 114867, 2023
42023
Runtime variability monitor for data retention characteristics of commercial NAND flash memory
M Buddhanoy, S Sakib, B Ray
2021 IEEE International Reliability Physics Symposium (IRPS), 1-5, 2021
42021
Flash-DNA: Identifying NAND flash memory origins using intrinsic array properties
S Sakib, A Milenković, B Ray
IEEE Transactions on Electron Devices 68 (8), 3794-3800, 2021
32021
New Total-Ionizing-Dose Resistant Data Storing Technique for NAND Flash Memory
M Buddhanoy, S Sakib, U Surendranathan, M Wasiolek, K Hattar, ...
IEEE Transactions on Device and Materials Reliability 22 (3), 438-446, 2022
12022
Hardware security primitives using NAND flash memory
MS Sakib
The University of Alabama in Huntsville, 2021
2021
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