Sebastien Tixier
Sebastien Tixier
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Cited by
Cited by
Molecular beam epitaxy growth of
S Tixier, M Adamcyk, T Tiedje, S Francoeur, A Mascarenhas, P Wei, ...
Applied physics letters 82 (14), 2245-2247, 2003
Band gap of
S Francoeur, MJ Seong, A Mascarenhas, S Tixier, M Adamcyk, T Tiedje
Applied physics letters 82 (22), 3874-3876, 2003
Giant Spin-Orbit Bowing in
B Fluegel, S Francoeur, A Mascarenhas, S Tixier, EC Young, T Tiedje
Physical review letters 97 (6), 067205, 2006
Surfactant enhanced growth of GaNAs and InGaNAs using bismuth
S Tixier, M Adamcyk, EC Young, JH Schmid, T Tiedje
Journal of crystal growth 251 (1-4), 449-454, 2003
Bismuth surfactant growth of the dilute nitride GaNxAs1− x
EC Young, S Tixier, T Tiedje
Journal of crystal growth 279 (3-4), 316-320, 2005
Bi isoelectronic impurities in GaAs
S Francoeur, S Tixier, E Young, T Tiedje, A Mascarenhas
Physical Review B—Condensed Matter and Materials Physics 77 (8), 085209, 2008
Band gaps of the dilute quaternary alloys GaNxAs1− x− yBiy and Ga1− yInyNxAs1− x
S Tixier, SE Webster, EC Young, T Tiedje, S Francoeur, A Mascarenhas, ...
Applied Physics Letters 86 (11), 2005
Active cloud point controller for refining applications and related method
GE Stewart, JT Donner, S Tixier, FM Haran, CP Luebke
US Patent 9,223,301, 2015
A new fabrication process for Ni–Ti shape memory thin films
T Lehnert, S Tixier, P Böni, R Gotthardt
Materials Science and Engineering: A 273, 713-716, 1999
Hardness enhancement of sputtered Ni3Al/Ni multilayers
S Tixier, P Böni, H Van Swygenhoven
Thin Solid Films 342 (1-2), 188-193, 1999
Bi-induced vibrational modes in GaAsBi
MJ Seong, S Francoeur, S Yoon, A Mascarenhas, S Tixier, M Adamcyk, ...
Superlattices and Microstructures 37 (6), 394-400, 2005
Grazing-incidence diffraction from multilayers
GT Baumbach, S Tixier, U Pietsch, V Holı
Physical Review B 51 (23), 16848, 1995
Spectroscopic sensor for measuring sheet properties
S Tixier, DA Gordon, FM Haran
US Patent 7,382,456, 2008
Ion beam characterization of GaAs1− x− yNxBiy epitaxial layers
P Wei, S Tixier, M Chicoine, S Francoeur, A Mascarenhas, T Tiedje, ...
Nuclear Instruments and Methods in Physics Research Section B: Beam …, 2004
Challenges in the field of large-m supermirrors
P Böni, D Clemens, MS Kumar, S Tixier
Physica B: Condensed Matter 241, 1060-1067, 1997
Spectroscopy having correction for broadband distortion for analyzing multi-component samples
FM Haran, R Meijer-Drees, S Tixier
US Patent 7,868,296, 2011
Stress minimisation in sputtered Ni/Ti supermirrors
MS Kumar, P Böni, S Tixier, D Clemens
Physica B: Condensed Matter 241, 95-97, 1997
Electron densities for the outer valence orbitals of pyridine: comparison of EMS measurements with near Hartree–Fock limit and density functional theory calculations
S Tixier, WA Shapley, Y Zheng, DP Chong, CE Brion, Z Shi, S Wolfe
Chemical Physics 270 (2), 263-276, 2001
Apparatus and method for controlling autotroph cultivation
AM Fuxman, S Tixier, GE Stewart, FM Haran, JU Backstrom, K Gerbrandt
US Patent 8,478,444, 2013
Use of fluorescent nanoparticles to measure individual layer thicknesses or composition in multi-layer films and to calibrate secondary measurement devices
MKY Hughes, S Tixier
US Patent 7,858,953, 2010
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