William H. Robinson
William H. Robinson
Professor of Electrical Engineering, Vanderbilt University
Verified email at vanderbilt.edu - Homepage
Title
Cited by
Cited by
Year
Characterization of digital single event transient pulse-widths in 130-nm and 90-nm CMOS technologies
B Narasimham, BL Bhuva, RD Schrimpf, LW Massengill, MJ Gadlage, ...
IEEE Transactions on Nuclear Science 54 (6), 2506-2511, 2007
1962007
On-chip characterization of single-event transient pulsewidths
B Narasimham, V Ramachandran, BL Bhuva, RD Schrimpf, AF Witulski, ...
IEEE Transactions on Device and Materials Reliability 6 (4), 542-549, 2006
1542006
A distributed intrusion detection system for resource-constrained devices in ad-hoc networks
AP Lauf, RA Peters, WH Robinson
Ad Hoc Networks 8 (3), 253-266, 2010
1112010
Fault simulation and emulation tools to augment radiation-hardness assurance testing
HM Quinn, DA Black, WH Robinson, SP Buchner
IEEE Transactions on Nuclear Science 60 (3), 2119-2142, 2013
1032013
Characterizing SRAM single event upset in terms of single and multiple node charge collection
JD Black, DR Ball II, WH Robinson, DM Fleetwood, RD Schrimpf, ...
IEEE Transactions on Nuclear Science 55 (6), 2943, 2008
932008
Effects of guard bands and well contacts in mitigating long SETs in advanced CMOS processes
B Narasimham, BL Bhuva, RD Schrimpf, LW Massengill, MJ Gadlage, ...
IEEE Transactions on Nuclear Science 55 (3), 1708-1713, 2008
722008
Securing commercial wifi-based uavs from common security attacks
M Hooper, Y Tian, R Zhou, B Cao, AP Lauf, L Watkins, WH Robinson, ...
MILCOM 2016-2016 IEEE Military Communications Conference, 1213-1218, 2016
712016
Using benchmarks for radiation testing of microprocessors and FPGAs
H Quinn, WH Robinson, P Rech, M Aguirre, A Barnard, M Desogus, ...
IEEE Transactions on Nuclear Science 62 (6), 2547-2554, 2015
702015
Modeling of Single Event Transients With Dual Double-Exponential Current Sources: Implications for Logic Cell Characterization
D Black, WH Robinson, IZ Wilcox, DB Limbrick, JD Black
IEEE Transactions on Nuclear Science 62 (4), 1540-1549, 2015
652015
Addressing negative racial and gendered experiences that discourage academic careers in engineering
WH Robinson, EO McGee, LC Bentley, SL Houston, PK Botchway
Computing in Science & Engineering 18 (2), 29-39, 2016
482016
Impact of Supply Voltage and Frequency on the Soft Error Rate of Logic Circuits
NN Mahatme, NJ Gaspard, S Jagannathan, TD Loveless, BL Bhuva, ...
Nuclear Science, IEEE Transactions on 60 (6), 4200-4206, 2013
472013
A low-power double edge-triggered flip-flop with transmission gates and clock gating
X Wang, WH Robinson
2010 53rd IEEE International Midwest Symposium on Circuits and Systems, 205-208, 2010
472010
Single-event mitigation in combinational logic using targeted data path hardening
V Srinivasan, AL Sternberg, AR Duncan, WH Robinson, BL Bhuva, ...
IEEE transactions on nuclear science 52 (6), 2516-2523, 2005
412005
Black engineering students’ motivation for PhD attainment: Passion plus purpose
EO McGee, DT White, AT Jenkins, S Houston, LC Bentley, WJ Smith, ...
Journal for Multicultural Education, 2016
402016
Filtergraph: An interactive web application for visualization of astronomy datasets
D Burger, KG Stassun, J Pepper, RJ Siverd, M Paegert, NM De Lee, ...
Astronomy and Computing 2, 40-45, 2013
372013
Reliability-aware synthesis of combinational logic with minimal performance penalty
DB Limbrick, NN Mahatme, WH Robinson, BL Bhuva
Nuclear Science, IEEE Transactions on 60 (4), 2776 - 2781, 2013
322013
Analysis of data-leak hardware Trojans in AES cryptographic circuits
T Reece, WH Robinson
2013 IEEE International Conference on Technologies for Homeland Security …, 2013
262013
Resilient and efficient MANET aerial communications for search and rescue applications
WH Robinson, AP Lauf
2013 International Conference on Computing, Networking and Communications …, 2013
262013
Design comparison to identify malicious hardware in external intellectual property
T Reece, DB Limbrick, WH Robinson
2011IEEE 10th International Conference on Trust, Security and Privacy in …, 2011
262011
A performance comparison between hardened-by-design and conventional-design standard cells
D Lunardini, B Narasimham, V Ramachandran, V Srinivasan, ...
2004 workshop on radiation effects on components and systems, radiation …, 2004
242004
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Articles 1–20