| PyGGI 2.0: language independent genetic improvement framework G An, A Blot, J Petke, S Yoo Proceedings of the 12th Joint Meeting on Foundations of Software Engineering …, 2019 | 25 | 2019 |
| Comparing line and AST granularity level for program repair using PyGGI G An, J Kim, S Yoo Proceedings of the 4th International Workshop on Genetic Improvement …, 2018 | 15 | 2018 |
| PyGGI: Python General framework for Genetic Improvement G An, J Kim, S Lee, S Yoo Proceedings of Korea Software Congress, 536-538, 2017 | 10 | 2017 |
| Searching for multi-fault programs in defects4j G An, J Yoon, S Yoo Search-Based Software Engineering: 13th International Symposium, SSBSE 2021 …, 2021 | 6 | 2021 |
| Assisting Bug Report Assignment Using Automated Fault Localisation: An Industrial Case Study J Sohn*, G An*, J Hong, D Hwang, S Yoo 2021 14th IEEE Conference on Software Testing, Verification and Validation …, 2021 | 5 | 2021 |
| Reducing the search space of bug inducing commits using failure coverage G An, S Yoo Proceedings of the 29th ACM Joint Meeting on European Software Engineering …, 2021 | 4 | 2021 |
| Ahead of Time Mutation Based Fault Localisation using Statistical Inference J Kim, G An, R Feldt, S Yoo arXiv preprint arXiv:1902.09729, 2019 | 4* | 2019 |
| FDG: A Precise Measurement of Fault Diagnosability Gain of Test Cases G An, S Yoo Proceedings of the 31st ACM SIGSOFT International Symposium on Software …, 2022 | 2* | 2022 |
| Automatically Identifying Shared Root Causes of Test Breakages in SAP HANA G An, J Yoon, J Sohn, J Hong, D Hwang, S Yoo 2022 IEEE/ACM 44th International Conference on Software Engineering …, 2022 | 2 | 2022 |
| The state and future of genetic improvement WB Langdon, W Weimer, C Timperley, O Krauss, ZY Ding, Y Lyu, ... ACM SIGSOFT Software Engineering Notes 44 (3), 25-29, 2019 | 2 | 2019 |
| Improving Test Distance for Failure Clustering with Hypergraph Modelling G An, J Yoon, JJ Whang, S Yoo arXiv preprint arXiv:2104.10360, 2021 | 1 | 2021 |
| Fonte: Finding Bug Inducing Commits from Failures G An, J Hong, N Kim, S Yoo arXiv preprint arXiv:2212.06376, 2022 | | 2022 |
Shin YooKorea Advanced Institute of Science and TechnologyVerified email at kaist.ac.kr
