Yi-Chun Chen

20182019202020212022202320243 3 6 8 39 35 16

Daniel Stanley TanOpen UniversiteitVerified email at ou.nl
Min SunChief AI Scientist at Appier Inc. and Associate Professor at National Tsing Hua University, EE deptVerified email at ee.nthu.edu.tw
Hou-Ning HuNational Tsing Hua UniversityVerified email at gapp.nthu.edu.tw
Shih-Han ChouThe University of British ColumbiaVerified email at cs.ubc.ca
Jianlong FuMicrosoft ResearchVerified email at microsoft.com
Liwei ChanNational Yang Ming Chiao Tung University (NYCU)Verified email at cs.nctu.edu.tw
Cheng SunNational Tsing Hua UniversityVerified email at gapp.nthu.edu.tw
Yu-Jhe LiResearch Scientist, MicrosoftVerified email at microsoft.com
Kris KitaniCarnegie Mellon University, Meta FAIRVerified email at andrew.cmu.edu
Jinhyung ParkPhD Student, Carnegie Mellon UniversityVerified email at andrew.cmu.edu

Yi-Chun Chen

Verified email at andrew.cmu.edu - Homepage


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TrustMAE: A noise-resilient defect classification framework using memory-augmented auto-encoders with trust regions DS Tan, YC Chen, TPC Chen, WC Chen Proceedings of the IEEE/CVF Winter Conference on Applications of Computer …, 2021	61	2021
Self-view grounding given a narrated 360 video SH Chou, YC Chen, KH Zeng, HN Hu, J Fu, M Sun Proceedings of the AAAI Conference on Artificial Intelligence 32 (1), 2018	21	2018
DLWV2: A Deep Learning-Based Wearable Vision-System with Vibrotactile-Feedback for Visually Impaired People to Reach Objects ML Shih, YC Chen, CY Tung, C Sun, CJ Cheng, L Chan, S Varadarajan, ... 2018 IEEE/RSJ International Conference on Intelligent Robots and Systems …, 2018	14	2018
Crack Detection and Refinement Via Deep Reinforcement Learning J Park, YC Chen, YJ Li, K Kitani 2021 IEEE International Conference on Image Processing (ICIP), 529-533, 2021	7	2021
Demystifying data and AI for manufacturing: case studies from a major computer maker YC Chen, BH He, SS Lin, JH Soeseno, DS Tan, TPC Chen, WC Chen APSIPA Transactions on Signal and Information Processing 10, e4, 2021	6	2021
Method for labeling image YC Chen, TPC Chen, DSY Tan, WC Chen US Patent 11,176,419, 2021	1	2021
Method for training defect detector YC Chen, TPC Chen, DSY Tan, WC Chen US Patent 11,315,229, 2022		2022

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