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Jin-Su Oh
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Characteristics of an amorphous carbon layer as a diffusion barrier for an advanced copper interconnect
BS An, Y Kwon, JS Oh, C Lee, S Choi, H Kim, M Lee, S Pae, CW Yang
ACS Applied Materials & Interfaces 12 (2), 3104-3113, 2019
82019
Direct observation of texture memory in hydrogenation–disproportionation–desorption–recombination processed Nd-Fe-B magnets using electron backscatter diffraction
TH Kim, JS Oh, HR Cha, JG Lee, HW Kwon, CW Yang
Scripta Materialia 115, 6-9, 2016
62016
Quantification of crystallinity using zero‐loss filtered electron diffraction
BS An, Y Kwon, HW Cha, MC Kang, JS Oh, CW Yang
Microscopy Research and Technique 82 (1), 39-46, 2019
52019
Evaluation of ion/electron beam induced deposition for electrical connection using a modern focused ion beam system
BS An, Y Kwon, JS Oh, YJ Shin, J Ju, CW Yang
Applied Microscopy 49 (1), 1-5, 2019
42019
Amorphous TaxMnyOz layer as a diffusion barrier for advanced copper interconnects
BS An, Y Kwon, JS Oh, M Lee, S Pae, CW Yang
Scientific reports 9 (1), 1-10, 2019
32019
Low angle boundary migration of shot‐peened pure nickel investigated by electron channeling contrast imaging and electron backscatter diffraction
JS Oh, HW Cha, TH Kim, K Shin, CW Yang
Microscopy Research and Technique 82 (6), 849-855, 2019
32019
Precisely Controlled Synthesis of Hybrid Intermetallic–Metal Nanoparticles for Nitrate Electroreduction
J Yu, AF Kolln, D Jing, J Oh, H Liu, Z Qi, L Zhou, W Li, W Huang
ACS Applied Materials & Interfaces 13 (44), 52073-52081, 2021
22021
Interfacial reactions in Ni/6H-SiC at low temperatures
S Lim, JS Oh, Y Kwon, BS An, JH Bae, TH Kim, MH Park, HS Kim, ...
Journal of Nanoscience and Nanotechnology 16 (10), 10853-10857, 2016
22016
Optimal Conditions for Defect Analysis Using Electron Channeling Contrast Imaging
JS Oh, CW Yang
Applied Microscopy 46 (3), 164-166, 2016
22016
Improvements in Thermal Stability of Sb2Te3 by Modulation of Microstructure via Carbon Incorporation
S Hwang, JS Oh, TS Jung, D Kim, H Lim, C Lee, CW Yang, JH Kim, ...
ACS Applied Electronic Materials 3 (8), 3472-3481, 2021
12021
Phase Change via Intermediary Metastable Local Structure of Ge Atoms in Ge2Sb2Te5 Nanowires during Electrical Switching
M Ahn, JS Oh, D Park, H Jung, S Park, K Jeong, D Kim, NE Sung, KS Lee, ...
ACS Applied Electronic Materials 2 (8), 2418-2428, 2020
12020
Direct Observation of Ferroelectric Domain Switching of BaTiO3 Using In-Situ Transmission Electron Microscopy
KJ Jo, BS An, TH Kim, HW Cha, JS Oh, JH Lee, MY Kim, CW Yang
Science of Advanced Materials 8 (12), 2281-2285, 2016
12016
Phase-Change Behavior of Carbon-Doped Ge2Sb2Te5 Investigated by In Situ Electrical Biasing Transmission Electron Microscopy
BS An, JS Oh, TH Kim, SI Kim, YW Kim, JG Ahn, SW Nam, CW Yang
Science of Advanced Materials 8 (12), 2269-2275, 2016
12016
Recrystallization behavior of shot peened pure nickel investigated by backscattered electron techniques
JS Oh, SM Baek, TH Kim, HW Cha, KJ Jo, K Shin, CW Yang
Science of Advanced Materials 8 (11), 2103-2107, 2016
12016
Quantum computing hardware for HEP algorithms and sensing
MS Alam, S Belomestnykh, N Bornman, G Cancelo, YC Chao, ...
arXiv preprint arXiv:2204.08605, 2022
2022
Multi-modal electron microscopy study on decoherence sources and their stability in Nb based superconducting qubit
JS Oh, X Fang, TH Kim, M Lynn, M Kramer, M Zarea, JA Sauls, ...
arXiv preprint arXiv:2204.06041, 2022
2022
Quantum computing hardware for HEP algorithms and sensing
M Sohaib Alam, S Belomestnykh, N Bornman, G Cancelo, YC Chao, ...
arXiv e-prints, arXiv: 2204.08605, 2022
2022
Terahertz nano-imaging of heterogeneous dipole fields and charge scattering at a single nanojunction
S Haeuser, R Kim, J Park, L Zhou, M Kramer, M Field, C Kopas, J Mutus, ...
Bulletin of the American Physical Society, 2022
2022
Novel Method of Measuring the Thickness of Nanoscale Films Using Energy Dispersive X‐Ray Spectroscopy Line Scan Profiles
MC Kang, JS Oh, KY Song, HJ Lee, H Baik, CW Yang
Advanced Materials Interfaces 9 (7), 2101489, 2022
2022
Atomic-Level Structure of Mesoporous Hexagonal Boron Nitride Determined by High-Resolution Solid-State Multinuclear Magnetic Resonance Spectroscopy and Density Functional …
RW Dorn, PM Heintz, I Hung, K Chen, JS Oh, TH Kim, L Zhou, Z Gan, ...
Chemistry of Materials 34 (4), 1649-1665, 2022
2022
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