| Effect of interlayer interactions on exciton luminescence in atomic-layered MoS2 crystals JG Kim, WS Yun, S Jo, JD Lee, CH Cho Scientific reports 6 (1), 29813, 2016 | 48 | 2016 |
| Image-based quantitative analysis of foxing stains on old printed paper documents G Kim, JG Kim, K Kang, WS Yoo Heritage 2 (3), 2665-2677, 2019 | 31 | 2019 |
| Determination of Al molar fraction in AlxGa1-xN films by Raman scattering JG Kim, A Kimura, Y Kamei, N Hasuike, H Harima, K Kisoda, Y Simahara, ... Journal of Applied Physics 110 (3), 2011 | 26 | 2011 |
| Development of a tablet PC-based portable device for colorimetric determination of assays including COVID-19 and other pathogenic microorganisms WS Yoo, HS Han, JG Kim, K Kang, HS Jeon, JY Moon, H Park RSC advances 10 (54), 32946-32952, 2020 | 17 | 2020 |
| Extraction of colour information from digital images towards cultural heritage characterisation applications WS Yoo, JG Kim, K Kang, Y Yoo SPAFA Journal 5, 2021 | 16 | 2021 |
| Observation of longitudinal-optic-phonon-plasmon-coupled mode in n-type AlGaN alloy films J Gon Kim, A Kimura, Y Kamei, N Hasuike, H Harima, K Kisoda, ... Applied Physics Letters 99 (25), 2011 | 12 | 2011 |
| Extraction of Color Information and Visualization of Color Differences between Digital Images through Pixel-by-Pixel Color-Difference Mapping WS Yoo, K Kang, JG Kim, Y Yoo Heritage 5 (4), 3923-3945, 2022 | 10 | 2022 |
| Quantitative analysis of contact angle of water on SiC: polytype and polarity dependence JG Kim, WS Yoo, JY Park, WJ Lee ECS Journal of Solid State Science and Technology 9 (12), 123006, 2020 | 7 | 2020 |
| Non-catalytic direct growth of nanographene on MgO substrates S Kamoi, JG Kim, N Hasuike, K Kisoda, H Harima Japanese Journal of Applied Physics 53 (5S1), 05FD06, 2014 | 7 | 2014 |
| Effective mass of InN estimated by Raman scattering JG Kim, Y Kamei, N Hasuike, H Harima, K Kisoda, K Sasamoto, ... physica status solidi c 7 (7‐8), 1887-1889, 2010 | 6 | 2010 |
| Spectroscopic characterization of nitrogen-and boron-doped graphene layers S Kamoi, JG Kim, N Hasuike, K Kisoda, H Harima Japanese Journal of Applied Physics 54 (11), 115101, 2015 | 5 | 2015 |
| Etch pit investigation of free electron concentration controlled 4H-SiC HY Kim, YJ Shin, JG Kim, H Harima, J Kim, W Bahng Journal of crystal growth 369, 38-42, 2013 | 5 | 2013 |
| Image-Based Quantification of Color and Its Machine Vision and Offline Applications WS Yoo, K Kang, JG Kim, Y Yoo Technologies 11 (2), 49, 2023 | 4 | 2023 |
| Development of static and dynamic colorimetric analysis techniques using image sensors and novel image processing software for chemical, biological and medical applications WS Yoo, JG Kim, K Kang, Y Yoo Technologies 11 (1), 23, 2023 | 4 | 2023 |
| Identification of polytype and estimation of carrier concentration of silicon carbide wafers by analysis of apparent color using image processing software JG Kim, WS Yoo, YS Jang, WJ Lee, IG Yeo ECS Journal of Solid State Science and Technology 11 (6), 064003, 2022 | 3 | 2022 |
| Correlation between contact angle and surface roughness of silicon carbide wafers JG Kim, WS Yoo, WY Kim, WJ Lee ECS Journal of Solid State Science and Technology 10 (11), 113008, 2021 | 3 | 2021 |
| Effect of Various Crucibles for High Quality AIN Crystal Growth on SiC Seed by PVT Method HJ Lee, HT Lee, HW Shin, MS Park, YS Jang, WJ Lee, DY Kim, SK Hong, ... Materials Science Forum 821, 1007-1010, 2015 | 3 | 2015 |
| Raman scattering study on the influence of E-beam bombardment on Si electron lens GW Lee, YB Lee, DH Baek, JG Kim, HS Kim Molecules 26 (9), 2766, 2021 | 2 | 2021 |
| Quantitative Characterization of Surface Polarity Dependence of Wetting Properties of V-Doped SiC Using a Novel Image Analysis Technique JG Kim, WS Yoo, DS Kim, WJ Lee Materials Science Forum 1004, 284-289, 2020 | 2 | 2020 |
| Raman spectroscopic study of layered quaternary ferrite Ba12Fe28Ti15O84 M Deluca, LP Curecheriu, A Neagu, G Apachitei, MT Buscaglia, G Canu, ... Phase Transitions 86 (7), 661-669, 2013 | 2 | 2013 |
KISODA, Kenji/木曽田賢治Wakayama University, Professorwakayama-u.ac.jp의 이메일 확인됨
