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Simona Podda
Simona Podda
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Title
Cited by
Cited by
Year
Failure modes and mechanisms of DC‐aged GaN LEDs
G Meneghesso, S Levada, E Zanoni, S Podda, G Mura, M Vanzi, ...
physica status solidi (a) 194 (2), 389-392, 2002
852002
Reliability of visible GaN LEDs in plastic package
G Meneghesso, S Levada, E Zanoni, G Scamarcio, G Mura, E Zanoni, ...
Microelectronics Reliability 43, 1737-1742, 2003
752003
High brightness GaN LEDs degradation during dc and pulsed stress
M Meneghini, S Podda, A Morelli, R Pintus, L Trevisanello, ...
Microelectronics Reliability 46 (9-11), 1720-1724, 2006
712006
An automatic alignment procedure for a four-source photometric stereo technique applied to scanning electron microscopy
R Pintus, S Podda, M Vanzi
IEEE Transactions on Instrumentation and Measurement 57 (5), 989-996, 2008
342008
Microscopic biomineralization processes and Zn bioavailability: a synchrotron-based investigation of Pistacia lentiscus L. roots
G De Giudici, D Medas, C Meneghini, MA Casu, A Gianoncelli, A Iadecola, ...
Environmental Science and Pollution Research 22, 19352-19361, 2015
322015
Stability and performance evaluation of high-brightness light-emitting diodes under DC and pulsed bias conditions
M Meneghini, L Trevisanello, S Podda, S Buso, G Spiazzi, G Meneghesso, ...
Sixth International Conference on Solid State Lighting 6337, 134-141, 2006
302006
Investigation on ESD-stressed GaN/InGaN-on-sapphire blue LEDs
G Meneghesso, E Zanoni, M Vanzi
Microelectronics reliability 41, 1609-1614, 2001
262001
Accelerated carbonation by cement kiln dust in aqueous slurries: chemical and mineralogical investigation
D Medas, G Cappai, G De Giudici, M Piredda, S Podda
Greenhouse Gases: Science and Technology 7 (4), 692-705, 2017
182017
ESD protection structures for 20 V and 40 V power supply suitable for BCD6 smart power technology
L Sponton, L Cerati, G Croce, G Mura, S Podda, M Vanzi, G Meneghesso
microelectronics reliability 42, 1303-1306, 2002
182002
High brightness InGaN LEDs degradation at high injection current bias
S Levada, M Meneghini, E Zanoni, S Buso, G Spiazzi, G Meneghesso, ...
2006 IEEE International Reliability Physics Symposium Proceedings, 615-616, 2006
152006
Quantitative 3D reconstruction from BS imaging.
R Pintus, S Podda, F Mighela, M Vanzi
Microelectron. Reliab. 44 (9-11), 1547-1552, 2004
122004
CyTest–an innovative open-source platform for training and testing in cythopathology
L Lianas, ME Piras, E Musu, S Podda, F Frexia, E Ovcin, G Bussolati, ...
Procedia-Social and Behavioral Sciences 228, 674-681, 2016
82016
Image alignment for 3D reconstruction in a SEM
R Pintus, S Podda, M Vanzi
Microelectronics Reliability 45 (9-11), 1581-1584, 2005
72005
XEBIC at the Dual Beam
M Vanzi, S Podda, E Musu, R Cao
Microelectronics Reliability 53 (9-11), 1399-1402, 2013
42013
Improvements in automated photometric stereo 3D SEM
R Pintus, S Podda, M Vanzi
Microscopy and Microanalysis 14 (S2), 608-609, 2008
42008
Failure analysis of RuO2 thick film chip resistors
S Podda, G Cassanelli, F Fantini, M Vanzi
Microelectronics Reliability 44 (9-11), 1763-1767, 2004
32004
Backside failure analysis of GaAs ICs after ESD tests
G Meneghesso, A Cocco, G Mura, S Podda, M Vanzi
Microelectronics Reliability 42 (9-11), 1293-1298, 2002
32002
3D Sculptures From SEM Images
R Pintus, S Podda, M Vanzi
EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen …, 2008
22008
An automated lifetest equipment for optical emitters
M Giglio, G Martines, G Mura, S Podda, M Vanzi
Microelectronics Reliability 42 (9-11), 1311-1315, 2002
22002
Cy-TEST-A new platform for training and testing in cytopathology
L Lianas, ME Piras, E Musu, S Podda, F Frexia, E Ovcin, G Bussolati, ...
Diagnostic Pathology 2 (1), 2016
12016
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