| The impact of feature selection on defect prediction performance: An empirical comparison Z Xu, J Liu, Z Yang, G An, X Jia ISSRE--International Symposium on Software Reliability Engineering, 309-320, 2016 | 140 | 2016 |
| Software defect prediction based on kernel PCA and weighted extreme learning machine Z Xu, J Liu, X Luo, Z Yang, Y Zhang, P Yuan, Y Tang, T Zhang IST--Information and Software Technology, 2018 | 116 | 2018 |
| Noisy-As-Clean: Learning unsupervised denoising from the corrupted image J Xu, Y Huang, MM Cheng, L Liu, F Zhu, Z Xu, L Shao arXiv preprint arXiv:1906.06878, 2020 | 94* | 2020 |
| MICHAC: Defect prediction via feature selection based on maximal information coefficient with hierarchical agglomerative clustering Z Xu, J Xuan, J Liu, X Cui SANER--International Conference on Software Analysis, Evolution, and …, 2016 | 64 | 2016 |
| Cross-version defect prediction via hybrid active learning with kernel principal component analysis Z Xu, J Liu, X Luo, T Zhang SANER--International Conference on Software Analysis, Evolution and …, 2018 | 62 | 2018 |
| Cross Project Defect Prediction via Balanced Distribution Adaptation Based Transfer Learning Z Xu, S Pang, T Zhang, L Xiapu, L Jin, Y Tang, X Yu, L Xue JCST--Journal Of Computer Science and Technology, 2019 | 43 | 2019 |
| LDFR: Learning Deep Feature Representation for Software Defect Prediction Z Xu, S Li, J Xu, J Liu, X Luo, Y Zhang, T Zhang, J Keung, T Yutian JSS--Journal of Systems and Software, 2019 | 41 | 2019 |
| Cross Version Defect Prediction with Representative Data via Sparse Subset Selection Z Xu, S Li, Y Tang, X Luo, T Zhang, J Liu, J Xu ICPC--International Conference on Program Comprehension, 2018 | 37 | 2018 |
| Bug Severity Prediction Using Question-and-Answer Pairs from Stack Overflow Y Tan, S Xu, Z Wang, T Zhang, Z Xu, X Luo NASAC--National Software Application Conference, 2019 | 34 | 2019 |
| HDA: Cross-Project Defect Prediction via Heterogeneous Domain Adaptation With Dictionary Learning Z Xu, P Yuan, T Zhang, Y Tang, S Li, Z Xia IEEE ACCESS, 2018 | 31 | 2018 |
| A comprehensive comparative study of clustering-based unsupervised defect prediction models Z Xu, L Li, M Yan, J Liu, X Luo, J Grundy, Y Zhang, X Zhang Journal of Systems and Software 172, 110862, 2020 | 30 | 2020 |
| TSTSS: A Two-Stage Training Subset Selection Framework for Cross Version Defect Prediction Z Xu, S Li, X Luo, J Liu, T Zhang, Y Tang, J Xu, P Yuan, J Keung JSS--Journal of Systems and Software, 2019 | 30 | 2019 |
| Improving Ranking-Oriented Defect Prediction Using a Cost-Sensitive Ranking SVM X Yu, J Liu, JW Keung, Q Li, KE Bennin, Z Xu, J Wang, X Cui TR--IEEE Transactions on Reliability, 2019 | 25 | 2019 |
| An Empirical Study of Learning to Rank Techniques for Effort-Aware Defect Prediction X Yu, KE Bennin, J Liu, JW Keung, X Yin, Z Xu SANER--International Conference on Software Analysis, Evolution and …, 2019 | 24 | 2019 |
| Simplified deep forest model based just-in-time defect prediction for Android mobile apps K Zhao, Z Xu, T Zhang, Y Tang, M Yan IEEE Transactions on Reliability 70 (2), 848-859, 2021 | 21 | 2021 |
| Two-Stage Attention-Based Model for Code Search with Textual and Structural Features L Xu, H Yang, C Liu, J Shuai, M Yan, Y Lei, Z Xu 2021 IEEE International Conference on Software Analysis, Evolution and …, 2021 | 18 | 2021 |
| All your app links are belong to us: understanding the threats of instant apps based attacks Y Tang, Y Sui, H Wang, X Luo, H Zhou, Z Xu Proceedings of the 28th ACM Joint Meeting on European Software Engineering …, 2020 | 16 | 2020 |
| Improving Log-Based Anomaly Detection with Component-Aware Analysis K Yin, M Yan, L Xu, Z Xu, Z Li, D Yang, X Zhang 2020 IEEE International Conference on Software Maintenance and Evolution …, 2020 | 13 | 2020 |
| A comprehensive investigation of the impact of feature selection techniques on crashing fault residence prediction models K Zhao, Z Xu, M Yan, T Zhang, D Yang, W Li Information and Software Technology 139, 106652, 2021 | 12 | 2021 |
| Stan: Towards describing bytecodes of smart contract X Li, T Chen, X Luo, T Zhang, L Yu, Z Xu 2020 IEEE 20th International Conference on Software Quality, Reliability and …, 2020 | 12 | 2020 |
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