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Jeongju Sohn
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Fluccs: Using code and change metrics to improve fault localization
J Sohn, S Yoo
Proceedings of the 26th ACM SIGSOFT International Symposium on Software …, 2017
1222017
Search based repair of deep neural networks
J Sohn, S Kang, S Yoo
arXiv preprint arXiv:1912.12463, 2019
222019
Empirical evaluation of fault localisation using code and change metrics
J Sohn, S Yoo
IEEE Transactions on Software Engineering 47 (8), 1605-1625, 2019
122019
Amortised deep parameter optimisation of GPGPU work group size for OpenCV
J Sohn, S Lee, S Yoo
International Symposium on Search Based Software Engineering, 211-217, 2016
82016
Why train-and-select when you can use them all? Ensemble model for fault localisation
J Sohn, S Yoo
Proceedings of the Genetic and Evolutionary Computation Conference, 1408-1416, 2019
62019
Learning fault localisation for both humans and machines using multi-objective GP
K Choi, J Sohn, S Yoo
International Symposium on Search Based Software Engineering, 349-355, 2018
42018
Empirical evaluation of conditional operators in GP based fault localization
D Kang, J Sohn, S Yoo
Proceedings of the Genetic and Evolutionary Computation Conference, 1295-1302, 2017
42017
Assisting Bug Report Assignment Using Automated Fault Localisation: An Industrial Case Study
J Sohn, G An, J Hong, D Hwang, S Yoo
2021 14th IEEE Conference on Software Testing, Verification and Validation …, 2021
32021
What Made This Test Flake? Pinpointing Classes Responsible for Test Flakiness
S Habchi, G Haben, J Sohn, A Franci, M Papadakis, M Cordy, YL Traon
arXiv preprint arXiv:2207.10143, 2022
2022
Using Evolutionary Coupling to Establish Relevance Links Between Tests and Code Units. A case study on fault localization
J Sohn, M Papadakis
arXiv preprint arXiv:2203.11343, 2022
2022
An empirical study of async wait flakiness in front-end testing
Y Pei, S Habchi, R Rwemalika, J Sohn, M Papadakis
2022
Arachne: Search Based Repair of Deep Neural Networks
J Sohn, S Kang, S Yoo
ACM Transactions on Software Engineering and Methodology, 2022
2022
Automatically Identifying Shared Root Causes of Test Breakages in SAP HANA
G An, J Yoon, J Sohn, J Hong, D Hwang, S Yoo
2022
Leveraging Fault Localisation to Enhance Defect Prediction
J Sohn, Y Kamei, S McIntosh, S Yoo
2021 IEEE International Conference on Software Analysis, Evolution and …, 2021
2021
Bridging fault localisation and defect prediction
J Sohn
2020 IEEE/ACM 42nd International Conference on Software Engineering …, 2020
2020
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학술자료 1–15