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Sangsu Park
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Excellent Selector Characteristics of Nanoscale for High-Density Bipolar ReRAM Applications
M Son, J Lee, J Park, J Shin, G Choi, S Jung, W Lee, S Kim, S Park, ...
Electron Device Letters, IEEE, 1-3, 2011
2792011
Analog memory and spike-timing-dependent plasticity characteristics of a nanoscale titanium oxide bilayer resistive switching device
K Seo, I Kim, S Jung, M Jo, S Park, J Park, J Shin, KP Biju, J Kong, K Lee, ...
Nanotechnology 22, 254023, 2011
2792011
Neuromorphic hardware system for visual pattern recognition with memristor array and CMOS neuron
M Chu, B Kim, S Park, H Hwang, M Jeon, BH Lee, BG Lee
IEEE Transactions on Industrial Electronics 62 (4), 2410-2419, 2014
2332014
Optimization of Conductance Change in Pr1–xCaxMnO3-Based Synaptic Devices for Neuromorphic Systems
JW Jang, S Park, GW Burr, H Hwang, YH Jeong
IEEE Electron Device Letters 36 (5), 457-459, 2015
1842015
RRAM-based synapse for neuromorphic system with pattern recognition function
S Park, H Kim, M Choo, J Noh, A Sheri, S Jung, K Seo, J Park, S Kim, ...
2012 international electron devices meeting, 10.2. 1-10.2. 4, 2012
1682012
Electronic system with memristive synapses for pattern recognition
S Park, M Chu, J Kim, J Noh, M Jeon, B Hun Lee, H Hwang, B Lee, B Lee
Scientific reports 5 (1), 1-9, 2015
1572015
-based metal-insulator-metal selection device for bipolar resistive random access memory cross-point application
J Shin, I Kim, KP Biju, M Jo, J Park, J Lee, S Jung, W Lee, S Kim, S Park, ...
Journal of Applied Physics 109 (3), 033712, 2011
1552011
Neuromorphic speech systems using advanced ReRAM-based synapse
S Park, A Sheri, J Kim, J Noh, J Jang, M Jeon, B Lee, BR Lee, BH Lee, ...
2013 IEEE International Electron Devices Meeting, 25.6. 1-25.6. 4, 2013
1502013
High Current Density and Nonlinearity Combination of Selection Device Based on TaOx/TiO2/TaOx Structure for One Selector–One Resistor Arrays
W Lee, J Park, S Kim, J Woo, J Shin, G Choi, S Park, D Lee, E Cha, ...
ACS nano 6 (9), 8166-8172, 2012
1372012
Nanoscale RRAM-based synaptic electronics: toward a neuromorphic computing device
S Park, J Noh, M Choo, AM Sheri, M Chang, YB Kim, CJ Kim, M Jeon, ...
nanotechnology 24 (38), 384009, 2013
1262013
Diode-less nano-scale ZrOx/HfOx RRAM device with excellent switching uniformity and reliability for high-density cross-point memory applications
J Lee, J Shin, D Lee, W Lee, S Jung, M Jo, J Park, KP Biju, S Kim, S Park, ...
Electron Devices Meeting (IEDM), 2010 IEEE International, 19.5. 1-19.5. 4, 2010
1242010
Diode-less bilayer oxide (WOx–NbOx) device for cross-point resistive memory applications
X Liu, SM Sadaf, M Son, J Shin, J Park, J Lee, S Park, H Hwang
Nanotechnology 22, 475702, 2011
1042011
Multibit Operation of -Based ReRAM by Schottky Barrier Height Engineering
J Park, KP Biju, S Jung, W Lee, J Lee, S Kim, S Park, J Shin, H Hwang
Electron Device Letters, IEEE 32 (4), 476-478, 2011
962011
Ultrathin (<10nm) Nb2O5/NbO2hybrid memory with both memory and selector characteristics for high density 3D vertically stackable RRAM applications
S Kim, X Liu, J Park, S Jung, W Lee, J Woo, J Shin, G Choi, C Cho, S Park, ...
2012 Symposium on VLSI Technology (VLSIT), 155-156, 2012
912012
Varistor-type bidirectional switch (JMAX>107A/cm2, selectivity∼104) for 3D bipolar resistive memory arrays
W Lee, J Park, J Shin, J Woo, S Kim, G Choi, S Jung, S Park, D Lee, ...
2012 Symposium on VLSI Technology (VLSIT), 37-38, 2012
872012
Threshold-switching characteristics of a nanothin-NbO2-layer-based Pt/NbO2/Pt stack for use in cross-point-type resistive memories
S Kim, J Park, J Woo, C Cho, W Lee, J Shin, G Choi, S Park, D Lee, ...
Microelectronic Engineering 107, 33-36, 2013
642013
In situ TEM observation on the interface-type resistive switching by electrochemical redox reactions at a TiN/PCMO interface
K Baek, S Park, J Park, YM Kim, H Hwang, SH Oh
Nanoscale 9 (2), 582-593, 2017
612017
Scanning Probe Microscopy
HT Soh, KW Guarini, CF Quate
New York: Kluwer Academic Publishers, 2001
602001
Non-volatile memory device and method of operating the same
T Kim, K Kwack, S Park
US Patent 7,863,673, 2011
592011
Self-Selective Characteristics of Nanoscale Devices for High-Density ReRAM Applications
M Son, X Liu, SM Sadaf, D Lee, S Park, W Lee, S Kim, J Park, J Shin, ...
IEEE electron device letters 33 (5), 718-720, 2012
572012
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