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Yunho Kim
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Ask the mutants: Mutating faulty programs for fault localization
S Moon, Y Kim, M Kim, S Yoo
2014 IEEE Seventh International Conference on Software Testing, Verification …, 2014
2082014
Directed test suite augmentation: techniques and tradeoffs
Z Xu, Y Kim, M Kim, G Rothermel, MB Cohen
Proceedings of the eighteenth ACM SIGSOFT international symposium on …, 2010
1192010
Mutation-based fault localization for real-world multilingual programs (T)
S Hong, B Lee, T Kwak, Y Jeon, B Ko, Y Kim, M Kim
2015 30th IEEE/ACM International Conference on Automated Software …, 2015
592015
Automated unit testing of large industrial embedded software using concolic testing
Y Kim, Y Kim, T Kim, G Lee, Y Jang, M Kim
2013 28th IEEE/ACM International Conference on Automated Software …, 2013
542013
Industrial application of concolic testing approach: A case study on libexif by using CREST-BV and KLEE
Y Kim, M Kim, YJ Kim, Y Jang
2012 34th International Conference on Software Engineering (ICSE), 1143-1152, 2012
532012
A scalable distributed concolic testing approach: An empirical evaluation
M Kim, Y Kim, G Rothermel
2012 IEEE Fifth International Conference on Software Testing, Verification …, 2012
512012
A hybrid directed test suite augmentation technique
Z Xu, Y Kim, M Kim, G Rothermel
2011 IEEE 22nd International Symposium on Software Reliability Engineering …, 2011
412011
A comparative study of software model checkers as unit testing tools: An industrial case study
M Kim, Y Kim, H Kim
IEEE transactions on software engineering 37 (2), 146-160, 2010
412010
Industrial application of concolic testing on embedded software: Case studies
M Kim, Y Kim, Y Jang
2012 IEEE Fifth International Conference on Software Testing, Verification …, 2012
392012
Concolic testing of the multi-sector read operation for flash storage platform software
M Kim, Y Kim, Y Choi
Formal Aspects of Computing 24 (3), 355-374, 2012
352012
MUSEUM: Debugging real-world multilingual programs using mutation analysis
S Hong, T Kwak, B Lee, Y Jeon, B Ko, Y Kim, M Kim
Information and Software Technology 82, 80-95, 2017
312017
SCORE: a scalable concolic testing tool for reliable embedded software
Y Kim, M Kim
Proceedings of the 19th ACM SIGSOFT symposium and the 13th European …, 2011
312011
Precise concolic unit testing of C programs using extended units and symbolic alarm filtering
Y Kim, Y Choi, M Kim
Proceedings of the 40th International Conference on Software Engineering …, 2018
262018
Formal verification of a flash memory device driver–an experience report
M Kim, Y Choi, Y Kim, H Kim
International SPIN Workshop on Model Checking of Software, 144-159, 2008
262008
Concolic testing of the multi-sector read operation for flash memory file system
M Kim, Y Kim
Brazilian Symposium on Formal Methods, 251-265, 2009
252009
Concolic testing of the multi-sector read operation for flash memory file system
M Kim, Y Kim
Brazilian Symposium on Formal Methods, 251-265, 2009
252009
Hybrid directed test suite augmentation: An interleaving framework
Y Kim, Z Zu, M Kim, MB Cohen, G Rothermel
2014 IEEE Seventh International Conference on Software Testing, Verification …, 2014
232014
Precise learn-to-rank fault localization using dynamic and static features of target programs
Y Kim, S Mun, S Yoo, M Kim
ACM Transactions on Software Engineering and Methodology (TOSEM) 28 (4), 1-34, 2019
222019
Directed test suite augmentation: an empirical investigation
Z Xu, Y Kim, M Kim, MB Cohen, G Rothermel
Software Testing, Verification and Reliability 25 (2), 77-114, 2015
212015
Music: Mutation analysis tool with high configurability and extensibility
DL Phan, Y Kim, M Kim
2018 IEEE International Conference on Software Testing, Verification and …, 2018
182018
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