Electron mean free path in elemental metals D Gall Journal of applied physics 119 (8), 2016 | 841 | 2016 |
Pathways of atomistic processes on TiN(001) and (111) surfaces during film growth: an ab initio study D Gall, S Kodambaka, MA Wall, I Petrov, JE Greene Journal of Applied Physics 93 (11), 9086-9094, 2003 | 371 | 2003 |
Growth of poly- and single-crystal ScN on MgO(001): Role of low-energy irradiation in determining texture, microstructure evolution, and mechanical properties D Gall, I Petrov, N Hellgren, L Hultman, JE Sundgren, JE Greene Journal of Applied Physics 84 (11), 6034-6041, 1998 | 259 | 1998 |
CrN–Ag self-lubricating hard coatings CP Mulligan, D Gall Surface and Coatings Technology 200 (5-6), 1495-1500, 2005 | 187 | 2005 |
Growth of Y-shaped nanorods through physical vapor deposition J Wang, H Huang, SV Kesapragada, D Gall Nano letters 5 (12), 2505-2508, 2005 | 181 | 2005 |
Electron scattering at surfaces and grain boundaries in Cu thin films and wires JS Chawla, F Gstrein, KP O’Brien, JS Clarke, D Gall Physical Review B 84 (23), 235423, 2011 | 179 | 2011 |
Vacancy hardening in single-crystal layers CS Shin, D Gall, N Hellgren, J Patscheider, I Petrov, JE Greene Journal of applied physics 93 (10), 6025-6028, 2003 | 173 | 2003 |
Valence electron concentration as an indicator for mechanical properties in rocksalt structure nitrides, carbides and carbonitrides K Balasubramanian, SV Khare, D Gall Acta Materialia 152, 175-185, 2018 | 172 | 2018 |
Electronic structure of ScN determined using optical spectroscopy, photoemission, and ab initio calculations D Gall, M Städele, K Järrendahl, I Petrov, P Desjardins, RT Haasch, ... Physical Review B 63 (12), 125119, 2001 | 169 | 2001 |
The influence of surface roughness on electrical conductance of thin Cu films: An ab initio study V Timoshevskii, Y Ke, H Guo, D Gall Journal of Applied Physics 103 (11), 2008 | 164 | 2008 |
The search for the most conductive metal for narrow interconnect lines D Gall Journal of Applied Physics 127 (5), 2020 | 157 | 2020 |
Resistivity of thin Cu films with surface roughness Y Ke, F Zahid, V Timoshevskii, K Xia, D Gall, H Guo Physical Review B 79 (15), 155406, 2009 | 157 | 2009 |
Growth of single-crystal CrN on MgO (001): Effects of low-energy ion-irradiation on surface morphological evolution and physical properties D Gall, CS Shin, T Spila, M Odén, MJH Senna, JE Greene, I Petrov Journal of Applied Physics 91 (6), 3589-3597, 2002 | 156 | 2002 |
Nanospring pressure sensors grown by glancing angle deposition SV Kesapragada, P Victor, O Nalamasu, D Gall Nano letters 6 (4), 854-857, 2006 | 150 | 2006 |
Phase composition and microstructure of polycrystalline and epitaxial TaNx layers grown on oxidized Si (001) and MgO (001) by reactive magnetron sputter deposition CS Shin, YW Kim, D Gall, JE Greene, I Petrov Thin Solid Films 402 (1-2), 172-182, 2002 | 147 | 2002 |
Band gap in epitaxial NaCl-structure CrN (001) layers D Gall, CS Shin, RT Haasch, I Petrov, JE Greene Journal of Applied Physics 91 (9), 5882-5886, 2002 | 145 | 2002 |
Growth, surface morphology, and electrical resistivity of fully strained substoichiometric epitaxial layers on MgO(001) CS Shin, S Rudenja, D Gall, N Hellgren, TY Lee, I Petrov, JE Greene Journal of Applied Physics 95 (1), 356-362, 2004 | 143 | 2004 |
Surface and bulk electronic structure of ScN (001) investigated by scanning tunneling microscopy/spectroscopy and optical absorption spectroscopy HA Al-Brithen, AR Smith, D Gall Physical Review B 70 (4), 045303, 2004 | 141 | 2004 |
Microstructure and electronic properties of the refractory semiconductor ScN grown on MgO (001) by ultra-high-vacuum reactive magnetron sputter deposition D Gall, I Petrov, LD Madsen, JE Sundgren, JE Greene Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 16 (4 …, 1998 | 129 | 1998 |
Molecular beam epitaxy control of the structural, optical, and electronic properties of ScN (001) AR Smith, HAH Al-Brithen, DC Ingram, D Gall Journal of Applied Physics 90 (4), 1809-1816, 2001 | 124 | 2001 |