Nobumichi Tamura
Nobumichi Tamura
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Quantitative speciation of heavy metals in soils and sediments by synchrotron X-ray techniques
A Manceau, MA Marcus, N Tamura
Reviews in Mineralogy and Geochemistry 49 (1), 341-428, 2002
Scanning X-ray microdiffraction with submicrometer white beam for strain/stress and orientation mapping in thin films
N Tamura, AA MacDowell, R Spolenak, BC Valek, JC Bravman, ...
Journal of synchrotron radiation 10 (2), 137-143, 2003
Effect of surface microstructure on electrochemical performance of garnet solid electrolytes
L Cheng, W Chen, M Kunz, K Persson, N Tamura, G Chen, M Doeff
ACS applied materials & interfaces 7 (3), 2073-2081, 2015
Synchrotron X-ray analytical techniques for studying materials electrochemistry in rechargeable batteries
F Lin, Y Liu, X Yu, L Cheng, A Singer, OG Shpyrko, HL Xin, N Tamura, ...
Chemical reviews 117 (21), 13123-13186, 2017
Extended mapping and exploration of the vanadium dioxide stress-temperature phase diagram
J Cao, Y Gu, W Fan, LQ Chen, DF Ogletree, K Chen, N Tamura, M Kunz, ...
Nano letters 10 (7), 2667-2673, 2010
Molecular-scale speciation of Zn and Ni in soil ferromanganese nodules from loess soils of the Mississippi Basin
A Manceau, N Tamura, RS Celestre, AA MacDowell, N Geoffroy, ...
Environmental Science & Technology 37 (1), 75-80, 2003
Tin whiskers studied by synchrotron radiation scanning X-ray micro-diffraction
WJ Choi, TY Lee, KN Tu, N Tamura, RS Celestre, AA MacDowell, ...
Acta Materialia 51 (20), 6253-6261, 2003
Evidence for a cluster-based structure of AlPdMn single quasicrystals
P Ebert, M Feuerbacher, N Tamura, M Wollgarten, K Urban
Physical review letters 77 (18), 3827, 1996
Submicron x-ray diffraction and its applications to problems in materials and environmental science
N Tamura, RS Celestre, AA MacDowell, HA Padmore, R Spolenak, ...
Review of scientific instruments 73 (3), 1369-1372, 2002
Lattice strain causes non-radiative losses in halide perovskites
TW Jones, A Osherov, M Alsari, M Sponseller, BC Duck, YK Jung, ...
Energy & Environmental Science 12 (2), 596-606, 2019
Natural speciation of Zn at the micrometer scale in a clayey soil using X-ray fluorescence, absorption, and diffraction
A Manceau, MA Marcus, N Tamura, O Proux, N Geoffroy, B Lanson
Geochimica et Cosmochimica Acta 68 (11), 2467-2483, 2004
Mechanism of calcite co-orientation in the sea urchin tooth
CE Killian, RA Metzler, YUT Gong, IC Olson, J Aizenberg, Y Politi, FH Wilt, ...
Journal of the American Chemical Society 131 (51), 18404-18409, 2009
Visualization of charge distribution in a lithium battery electrode
J Liu, M Kunz, K Chen, N Tamura, TJ Richardson
The Journal of Physical Chemistry Letters 1 (14), 2120-2123, 2010
A dedicated superbend X-ray microdiffraction beamline for materials, geo-, and environmental sciences at the advanced light source
M Kunz, N Tamura, K Chen, AA MacDowell, RS Celestre, MM Church, ...
Review of Scientific Instruments 80 (3), 035108, 2009
Amorphous calcium carbonate particles form coral skeletons
T Mass, AJ Giuffre, CY Sun, CA Stifler, MJ Frazier, M Neder, N Tamura, ...
Proceedings of the National Academy of Sciences 114 (37), E7670-E7678, 2017
Mobile metallic domain walls in an all-in-all-out magnetic insulator
EY Ma, YT Cui, K Ueda, S Tang, K Chen, N Tamura, PM Wu, J Fujioka, ...
Science 350 (6260), 538-541, 2015
Using multi-criteria cost surface analysis to explore past regional landscapes: a case study of ritual activity and social interaction in Michigan, AD 1200–1600
MCL Howey
Journal of Archaeological Science 34 (11), 1830-1846, 2007
Deciphering Ni sequestration in soil ferromanganese nodules by combining X-ray fluorescence, absorption, and diffraction at micrometer scales of resolution
A Manceau, N Tamura, MA Marcus, AA MacDowell, RS Celestre, ...
American Mineralogist 87 (10), 1494-1499, 2002
X-ray microdiffraction study of growth modes and crystallographic tilts in oxide films on metal substrates
JD Budai, W Yang, N Tamura, JS Chung, JZ Tischler, BC Larson, GE Ice, ...
Nature Materials 2 (7), 487-492, 2003
Measurement of stresses in Cu and Si around through-silicon via by synchrotron X-ray microdiffraction for 3-dimensional integrated circuits
AS Budiman, HAS Shin, BJ Kim, SH Hwang, HY Son, MS Suh, QH Chung, ...
Microelectronics Reliability 52 (3), 530-533, 2012
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