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Prakash Pandey
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A simple edge termination design for vertical GaN PN diodes
P Pandey, TM Nelson, WM Collings, MR Hontz, DG Georgiev, AD Koehler, ...
IEEE Transactions on Electron Devices 69 (9), 5096-5103, 2022
172022
Hybrid edge termination in vertical GaN: approximating beveled edge termination via Discrete Implantations
T Nelson, P Pandey, DG Georgiev, MR Hontz, AD Koehler, KD Hobart, ...
IEEE Transactions on Electron Devices 69 (12), 6940-6947, 2022
72022
Hybrid Edge Termination for High-Voltage Vertical GaN Devices: Empirical Validation and Robust Processing Tolerance
P Pandey, TM Nelson, MR Hontz, DG Georgiev, R Khanna, AG Jacobs, ...
IEEE Transactions on Electron Devices, 2024
12024
Scaled Projections of Empirically Verified Hybrid Edge Terminated Vertical GaN Diodes to 20 kV
T Nelson, P Pandey, DG Georgiev, R Khanna, MR Hontz, AG Jacobs, ...
2023 IEEE 10th Workshop on Wide Bandgap Power Devices & Applications (WiPDA …, 2023
12023
Characterization and modeling of a 1.3 kV vertical GaN diode
P Pandey, W Collings, S Mahmud, T Nelson, MR Hontz, DG Georgiev, ...
2022 IEEE Applied Power Electronics Conference and Exposition (APEC), 928-935, 2022
12022
Scalable Selective Area Doping for Manufacturing of Planar Vertical Power GaN Devices
AG Jacobs, BN Feigelson, JK Hite, JA Spencer, P Pandey, DG Georgiev, ...
1
Experimental Validation of Robust Hybrid Edge Termination Structures in Vertical GaN pin Diodes with Avalanche Capability
JS Lundh, AG Jacobs, P Pandey, T Nelson, DG Georgiev, AD Koehler, ...
IEEE Electron Device Letters, 2024
2024
Design, Packaging, and Empirical Characterization of 1 kV Vertical GaN PN Diode
S Mahmud, P Pandey, SK Atwimah, T Nelson, DG Georgiev, AD Koehler, ...
2023 IEEE Applied Power Electronics Conference and Exposition (APEC), 2496-2502, 2023
2023
Multi-Layer Hybrid Edge Termination for III-N Power Devices
TJ Anderson, MA Ebrish, AD Koehler, AG Jacobs, MA Porter, KD Hobart, ...
US Patent App. 17/876,163, 2023
2023
Impact of Anode Doping on Avalanche in Vertical GaN Pin Diodes with Hybrid Edge Termination Design
M Ebrish, AG Jacobs, P Pandey, T Nelson, A Koehler, J Gallagher, ...
Electrochemical Society Meeting Abstracts 241, 1312-1312, 2022
2022
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