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Abc: Auxiliary balanced classifier for class-imbalanced semi-supervised learning
H Lee, S Shin, H Kim
Advances in Neural Information Processing Systems 34, 7082-7094, 2021
1002021
Semi-supervised multi-label learning for classification of wafer bin maps with mixed-type defect patterns
H Lee, H Kim
IEEE Transactions on Semiconductor Manufacturing 33 (4), 653-662, 2020
512020
Semi-supervised learning for simultaneous location detection and classification of mixed-type defect patterns in wafer bin maps
H Lee, J Lee, H Kim
IEEE Transactions on Semiconductor Manufacturing 36 (2), 220-230, 2023
142023
CDMAD: Class-Distribution-Mismatch-Aware Debiasing for Class-Imbalanced Semi-Supervised Learning
H Lee, H Kim
Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern ¡¦, 2024
62024
Classification of Chip-Level Defect Types in Wafer Bin Maps Using Only Wafer-Level Labels
H Lee, H Kim, H Kim
Journal of Manufacturing Science and Engineering 146 (7), 2024
2024
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