Outer-points shaver: Robust graph-based clustering via node cutting Y Kim, H Do, SB Kim Pattern Recognition 97, 107001, 2020 | 21 | 2020 |
Factors associated with hospital admission and severe outcomes for older patients with COVID‐19 J Kim, C Blaum, R Ferris, M Arcila‐Mesa, H Do, C Pulgarin, J Dolle, ... Journal of the American Geriatrics Society 70 (7), 1906-1917, 2022 | 16 | 2022 |
Fair generalized linear models with a convex penalty H Do, P Putzel, AS Martin, P Smyth, J Zhong International Conference on Machine Learning, 5286-5308, 2022 | 8 | 2022 |
Graph structured sparse subset selection H Do, MS Cheon, SB Kim Information Sciences 518, 71-94, 2020 | 6 | 2020 |
A joint fairness model with applications to risk predictions for underrepresented populations H Do, S Nandi, P Putzel, P Smyth, J Zhong Biometrics 79 (2), 826-840, 2023 | 5 | 2023 |
Hierarchical segment-channel attention network for explainable multichannel signal classification J Lee, H Do, M Kwak, H Kahng, SB Kim Information Sciences 567, 312-331, 2021 | 5 | 2021 |
Dynamic survival analysis for ehr data with personalized parametric distributions P Putzel, H Do, A Boyd, H Zhong, P Smyth Machine Learning for Healthcare Conference, 648-673, 2021 | 3 | 2021 |
Domain Generalization via Heckman-type Selection Models H Kahng, H Do, J Zhong The Eleventh International Conference on Learning Representations, 2022 | 2 | 2022 |
Proximity-based density description with regularized reconstruction algorithm for anomaly detection J Yu, H Do Information Sciences 654, 119816, 2024 | 1 | 2024 |
A Hierarchical Spatial-Test Attention Network for Explainable Multiple Wafer Bin Maps Classification H Do, C Lee, SB Kim IEEE Transactions on Semiconductor Manufacturing 35 (1), 78-86, 2021 | 1 | 2021 |
Fair Survival Time Prediction via Mutual Information Minimization H Do, Y Chang, YS Cho, P Smyth, J Zhong Machine Learning for Healthcare Conference, 2023 | | 2023 |
Early Diagnosis and Prediction of Wafer Quality Using Machine Learning on sub-10nm Logic Technology HK Ko, S Park, J Ryu, SR Kim, G Lee, D Lee, S Pae, E Lee, Y Ji, H Jiang, ... 2020 IEEE International Reliability Physics Symposium (IRPS), 1-5, 2020 | | 2020 |