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Alain Gibaud
Alain Gibaud
Le Mans Université
Verified email at univ-lemans.fr
Title
Cited by
Cited by
Year
X-ray and neutron reflectivity: principles and applications
J Daillant, A Gibaud
Springer, 2008
9022008
Thermally tunable optical constants of vanadium dioxide thin films measured by spectroscopic ellipsometry
JBK Kana, JM Ndjaka, G Vignaud, A Gibaud, M Maaza
Optics Communications 284 (3), 807-812, 2011
2262011
Visible‐light photocatalysis in titania‐based mesoporous thin films
SS Soni, MJ Henderson, JF Bardeau, A Gibaud
Advanced Materials 20 (8), 1493-1498, 2008
2152008
X-ray reflectivity and diffuse scattering
A Gibaud, S Hazra
Current Science, 1467-1477, 2000
2132000
Peering into the self-assembly of surfactant templated thin-film silica mesophases
DA Doshi, A Gibaud, V Goletto, M Lu, H Gerung, B Ocko, SM Han, ...
Journal of the American Chemical Society 125 (38), 11646-11655, 2003
2102003
Evaporation-controlled self-assembly of silica surfactant mesophases
A Gibaud, D Grosso, B Smarsly, A Baptiste, JF Bardeau, F Babonneau, ...
The Journal of Physical Chemistry B 107 (25), 6114-6118, 2003
1922003
Correlation between lithium intercalation capacity and microstructure in hard carbons
W Xing, JS Xue, T Zheng, A Gibaud, JR Dahn
Journal of the Electrochemical Society 143 (11), 3482, 1996
1851996
Quantitative SAXS analysis of the P123/water/ethanol ternary phase diagram
SS Soni, G Brotons, M Bellour, T Narayanan, A Gibaud
The journal of physical chemistry B 110 (31), 15157-15165, 2006
1802006
A small angle X-ray scattering study of carbons made from pyrolyzed sugar
A Gibaud, JS Xue, JR Dahn
Carbon 34 (4), 499-503, 1996
1481996
Effects of partial coherence on the scattering of x rays by matter
SK Sinha, M Tolan, A Gibaud
Physical Review B 57 (5), 2740, 1998
1471998
Postassembly chemical modification of a highly ordered organosilane multilayer: New insights into the structure, bonding, and dynamics of self-assembling silane monolayers
K Wen, R Maoz, H Cohen, J Sagiv, A Gibaud, A Desert, BM Ocko
ACS nano 2 (3), 579-599, 2008
1282008
The correction of geometrical factors in the analysis of X-ray reflectivity
A Gibaud, G Vignaud, SK Sinha
Acta Crystallographica Section A: Foundations of Crystallography 49 (4), 642-648, 1993
1131993
X-ray scattering studies of surface roughness of GaAs/A1As multilayers
SK Sinha, MK Sanyal, SK Satija, CF Majkrzak, DA Neumann, H Homma, ...
Physica B: Condensed Matter 198 (1-3), 72-77, 1994
1081994
Evaporation‐Induced Self‐Assembly (EISA) at Its Limit: Ultrathin, Crystalline Patterns by Templating of Micellar Monolayers
T Brezesinski, M Groenewolt, A Gibaud, N Pinna, M Antonietti, B Smarsly
Advanced Materials 18 (17), 2260-2263, 2006
1032006
Densification and depression in glass transition temperature in polystyrene thin films
G Vignaud, M S. Chebil, JK Bal, N Delorme, T Beuvier, Y Grohens, ...
Langmuir 30 (39), 11599-11608, 2014
1022014
Scattering study on the selective solvent swelling induced surface reconstruction
T Xu, JT Goldbach, MJ Misner, S Kim, A Gibaud, O Gang, B Ocko, ...
Macromolecules 37 (8), 2972-2977, 2004
1002004
Fourier reconstruction of density profiles of thin films using anomalous X-ray reflectivity
MK Sanyal, SK Sinha, A Gibaud, KG Huang, BL Carvalho, M Rafailovich, ...
Europhysics Letters 21 (6), 691, 1993
951993
X-ray, micro-raman, and infrared spectroscopy structural characterization of self-assembled multilayer silane films with variable numbers of stacked layers
A Baptiste, A Gibaud, JF Bardeau, K Wen, R Maoz, J Sagiv, BM Ocko
Langmuir 18 (10), 3916-3922, 2002
882002
Synthesis of hollow vaterite CaCO3 microspheres in supercritical carbon dioxide medium
T Beuvier, B Calvignac, GJR Delcroix, MK Tran, S Kodjikian, N Delorme, ...
Journal of Materials Chemistry 21 (26), 9757-9761, 2011
852011
Determination by x-ray reflectivity and small angle x-ray scattering of the porous properties of mesoporous silica thin films
S Dourdain, JF Bardeau, M Colas, B Smarsly, A Mehdi, BM Ocko, ...
Applied Physics Letters 86 (11), 2005
832005
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